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Structural properties of $Zn:LiNbO_3/Mg:LiNbO_3$ single crystal thin films grown by LPE method  

Lee, H.J. (Department of Advanced Materials Engineering, Sungkyunkwan University)
Shin, T.I. (Department of Advanced Materials Engineering, Sungkyunkwan University)
Lee, J.H. (Energy & Applied Optics Team, Korea Institute of Industrial Technology)
Yoon, D.H. (Department of Advanced Materials Engineering, Sungkyunkwan University)
Publication Information
Journal of the Korean Crystal Growth and Crystal Technology / v.15, no.3, 2005 , pp. 120-123 More about this Journal
Abstract
The 5 mol% ZnO doped $LiNbO_3$ film and the 2 mol% MgO doped $LiNbO_3$ film were grown on the $LiNbO_3$ (001) substrate by liquid phase epitaxy (LPE) method with $Li_2CO_3-V_2O_5$ flux system. The crytsallinity and the lattice mismatch between $Zn:LiNbO_3$, film and $Mg:LiNbO_3$, film were analyzed by x-ray rocking curve (XRC). In addition, the ZnO and MgO distribution in the cross-section of the multilayer thin films was observed using electron probe micro analyzer (EPMA).
Keywords
$LiNbO_3$; LPE method; Epitaxial layer; Photorefractive effect;
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