Characterization of Basal Plane Dislocations in PVT-Grown SiC by Transmission Electron Microscopy |
Jeong, Myoungho
(Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST))
Kim, Dong-Yeob (Department of Materials Science and Engineering, Chungnam National University) Hong, Soon-Ku (Department of Materials Science and Engineering, Chungnam National University) Lee, Jeong Yong (Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST)) Yeo, Im Gyu (Hybrid Materials Research Department, RIST) Eun, Tai-Hee (Hybrid Materials Research Department, RIST) Chun, Myoung-Chuel (POSCO Center) |
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