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http://dx.doi.org/10.3740/MRSK.2013.23.11.613

Effect of Sulfurization Temperature on the Properties of Cu2ZnSn(S,Se)4 Thin Films  

Yoo, Yeong Yung (National Center for Nanoprocess and Equipments, Honam Local Division, Korea Institute of Industrial Technology)
Hong, Chang Woo (Chonnam National University)
Gang, Myeng Gil (Chonnam National University)
Shin, Seung Wook (Department of Materials Science and Engineering, KAIST)
Kim, Young Baek (National Center for Nanoprocess and Equipments, Honam Local Division, Korea Institute of Industrial Technology)
Moon, Jong-Ha (Chonnam National University)
Lee, Yong Jeong (Department of Materials Science and Engineering, KAIST)
Kim, Jin Hyoek (Chonnam National University)
Publication Information
Korean Journal of Materials Research / v.23, no.11, 2013 , pp. 613-619 More about this Journal
Abstract
$Cu_2ZnSn(S_x,Se_{1-x})_4$ (CZTSSe) thin films were prepared by sulfurization of evaporated precursor thin films. Precursor was prepared using evaporation method at room temperature. The sulfurization was carried out in a graphite box with S powder at different temperatures. The temperatures were varied in a four step process from $520^{\circ}C$ to $580^{\circ}C$. The effects of the sulfurization temperature on the micro-structural, morphological, and compositional properties of the CZTSSe thin films were investigated using X-ray diffraction (XRD), Raman spectra, field emission scanning electron microscopy (FE-SEM), and transmission electron microscopy (TEM). The XRD and Raman results showed that the sulfurized thin films had a single kesterite crystal CZTSSe. From the FE-SEM and TEM results, the $Mo(S_x,Se_{1-x})_2$ (MoSSe) interfacial layers of the sulfurized CZTS thin films were observed and their thickness was seen to increase with increasing sulfurization temperature. The microstructures of the CZTSSe thin films were strongly related to the sulfurization temperatures. The voids in the CZTSSe thin films increased with the increasing sulfurization temperature.
Keywords
kesterite; CZTSSe; sulfurization; microstrucuture;
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