1 |
S. B. Shin, H. H. Shin, W. K. Kim and J. G. Jang, Kor. J. Mater. Res., 18(4), 199 (2008) (in Korean).
DOI
ScienceOn
|
2 |
C. C. Hwang, J. Soc. Inf. Disp., 16(3), 465 (2008).
DOI
|
3 |
H. Chen, Y. Gang, C. Wenbin, L. Kaijun and L. Feng,
Vacuum, 85(3), 448 (2010).
DOI
ScienceOn
|
4 |
V. Aimin, L. A. Gubanova and E. S. Putilin, J. Opt. Tech.,
73(8), 555 (2006).
DOI
|
5 |
J. R. Nicholls, V. Pereira, K. J. Lawson and D. S. Rickerby,
in Proceedings of Intelligent Processing of High Performance Materials (Brussels, Belgium, May 1998). ed. G. W. Hart (Research and Technology Organization, France, 1998) p.16-1.
|
6 |
E. Lee, Vacuum, 83(5), 848 (2009).
DOI
ScienceOn
|
7 |
L. I. Maissel and R. Glang, Handbook of Thin Film Technology, p.1-34, McGraw-Hill, New York, USA
(1970).
|