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http://dx.doi.org/10.3740/MRSK.2010.20.12.676

Fabrication of P-type Transparent Oxide Semiconductor SrCu2O2 Thin Films by RF Magnetron Sputtering  

Seok, Hye-Won (Korea Institute of Ceramic Engineering &Technology (KICET))
Kim, Sei-Ki (Korea Institute of Ceramic Engineering &Technology (KICET))
Lee, Hyun-Seok (Korea Institute of Ceramic Engineering &Technology (KICET))
Lim, Tae-Young (Korea Institute of Ceramic Engineering &Technology (KICET))
Hwang, Jong-Hee (Korea Institute of Ceramic Engineering &Technology (KICET))
Choi, Duck-Kyun (Department of Materials Science and Engineering, Han Yang University)
Publication Information
Korean Journal of Materials Research / v.20, no.12, 2010 , pp. 676-680 More about this Journal
Abstract
Most TCOs such as ITO, AZO(Al-doped ZnO), FTO(F-doped $SnO_2$) etc., which have been widely used in LCD, touch panel, solar cell, and organic LEDs etc. as transparent electrode material reveal n-type conductivity. But in order to realize transparent circuit, transparent p-n junction, and introduction of transparent p-type materials are prerequisite. Additional prerequisite condition is optical transparency in visible spectral region. Oxide based materials usually have a wide optical bandgap more than ~3.0 eV. In this study, single-phase transparent semiconductor of $SrCu_2O_2$, which shows p-type conductivity, have been synthesized by 2-step solid state reaction at $950^{\circ}C$ under $N_2$ atmosphere, and single-phase $SrCu_2O_2$ thin films of p-type TCOs have been deposited by RF magnetron sputtering on alkali-free glass substrate from single-phase target at $500^{\circ}C$, 1% $H_2$/(Ar + $H_2$) atmosphere. 3% $H_2$/(Ar + $H_2$) resulted in formation of second phases. Hall measurements confirmed the p-type nature of the fabricated $SrCu_2O_2$ thin films. The electrical conductivity, mobility of carrier and carrier density $5.27{\times}10^{-2}S/cm$, $2.2cm^2$/Vs, $1.53{\times}10^{17}/cm^3$ a room temperature, respectively. Transmittance and optical band-gap of the $SrCu_2O_2$ thin films revealed 62% at 550 nm and 3.28 eV. The electrical and optical properties of the obtained $SrCu_2O_2$ thin films deposited by RF magnetron sputtering were compared with those deposited by PLD and e-beam.
Keywords
thin film; sputtering; p-type; transparent conductive oxide; $SrCu_2O_2$;
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1 S. J. Tark, M. G. Kang and D. Kim, Kor. J. Mater. Res., 16(7), 449 (2006) (in Korean).   DOI   ScienceOn
2 H. Kawazoe, M. Yasukawa, H. Hoyodo, M. Kurita, H. Yanagi and H. Hosono, Nature, 389, 939 (1997).   DOI   ScienceOn
3 H. Yanagi, H. Kawazoe, A. Kudo, M. Yasukawa and H. Hosono, J. Electron., 4, 407 (2000).
4 H. Yanagi, T. Hase, S. Ibuki, K. Ueda and H. Hosono, Appl. Phys. Lett., 78, 1583 (2001).   DOI   ScienceOn
5 N. Duan, A. W. Sleight, M. K. Jayaraj and J. Tate, Appl. Phys. Lett., 77, 1325 (2000).   DOI   ScienceOn
6 A. Kudo, H. Yanagi, H. Hosono and H. Kawasoe, Appl. Phys. Lett., 73, 220 (1998).   DOI   ScienceOn
7 E. L. Papadopoulou, Z. A. Viskadourakis, A. V. Pennos, G. Huyberechts and E. Aperathitis, Thin Solid Films, 516(7), 1449 (2008).   DOI   ScienceOn
8 E. Bobeico, F. Varsano, C. Minarini and F. Roca, Thin Solid Films., 444, 70 (2003).   DOI   ScienceOn
9 R. O. Suzuki, P. Bohac and L. J. Gauckler, J. Am. Ceram. Soc., 75, 2833 (1992).   DOI
10 J. Tate, M. K. Jayaraj, A. D. Draeseke, T. Ulbrich, A. W. Sleight, K. A. Vanaja, R. Nagarajan, J. F. Wager and R. L. Hoffman, Thin Solid Films., 411, 119 (2002).   DOI   ScienceOn
11 K. Tonooka, K. Shimokawa and O. Nishimura, Thin Solid Films., 411, 129. (2002).   DOI   ScienceOn