Relationship Between Annealing Temperature and Structural Properties of BaTiO3 Thin Films Grown on p-Si Substrates |
Min, Ki-Deuk
(Nuclear Materials Research Center, Korea Atomin Energy Research Institute)
Kim, Dong-Jin (Department of Materials Engineering, Hanbat National University) Lee, Jong-Won (Department of Materials Engineering, Hanbat National University) Park, In-Yong (Department of Materials Engineering, Hanbat National University) Kim, Kyu-Jin (HumanElecs (Co. Ltd.)) |
1 | Handbook of X-ray Photoelectron Spectroscopy, J. F. Moulder, Eden Prairie, Physical Electronics, Inc (1995) |
2 | K. Okazaki, Ceramic Engineering for Dielectrics, Gakken-Sha Publishing Co., Tokyo, (1983) |
3 | T. Nomura, T. Yamaguchi, Ceram. Bull., 59[4], 453(1980) |
4 | A. Lotnyk, A. Graff, S. Senz, N. D. Zakharov, D. Hesse, Sol. Sta. Sci., 1 (2007) |
5 | M. Shimizu, M. Fujimoto and E. Tanikawa, Mater. Res. Soc. Symp. Proc., 310, 255 (1993) |
6 | J. K. G. Panitz, C. C. Hu, Ferroelectrics, 47, 161 (1980) |
7 | D. J. McClure, J. R. Crowe, J. Vac. Sci. Technol., 16, 311 (1979) DOI ScienceOn |
8 | E. K. Evangelou, N. Konofaos, X. Alsanoglou, S. Kennon and C. B. Thomas, Mater. Sci. Semi. Pro., 4, 305 (2001) DOI ScienceOn |
9 | N. Y. Lee, T. Sekine, Y. Ito and K. Vchino, Jpn. J. Appl. Phys., 33, 1484 (1994) DOI |
10 | Q. X. Jia, J. L. Smith, Philosophical Magazine B, 77, 163 (1998) DOI |
11 | H. B. Kim, S. H. Lee, J. M. Kim, I. C. Park and S. M. Lee, J. Ind. Sci. Chongju Univ., 16, 103 (1998) |
12 | J. M. Ahn, D. K. Choi and Y. H. Kim, J. Kor. Cer. Soc., 31, 886 (1994) |
13 | P. Pertosa, Phys. Rev. B, 17, 2011 (1978) DOI |
14 | J. Gottmann, B. Vosseler and E. W. Kreutz, Appl. Sur. Sci., 197-198, 831 (2002) DOI ScienceOn |
15 | T. Yoshimura, N. Fujimura, T. Ito, J. Cry. Growth, 174, 790 (1997) DOI ScienceOn |
16 | M.Cernea, I. Matei, C. Logofatu, J. Meter. Sci., 36, 5027 (2001) DOI ScienceOn |
17 | E. K. Evangelou, N. Konofauos, Philosophical Magazine B, 80, 395 (2000) DOI |
18 | J. Wang, T. Zhang and J. Xiang, B. Zhang, Mater. Chem. Phy., 108(2), 445 (2008) DOI ScienceOn |
19 | M. R. Craven, W. M. Cranton, S. Toal and H. S. Reehal, Semi. Sci. Techol., 13, 404 (1998) DOI ScienceOn |
20 | Seif A. Nasser, Appl. Sur. Sci., 157, 14 (2000) DOI ScienceOn |
21 | L. Preda, L. Courselle, B. Despax and J. Bandet, Adelina Ianculescu, Thin Solid Films., 389, 43 (2001) DOI ScienceOn |
22 | B. Wang, L. D. Zhang, L. Zhang, Y. Yan and S. L. Zhang, Thin Solid Films, 354, 262 (1999) DOI ScienceOn |
23 | E. K. Evangelou, N. Konofauos, M. R. Craven, W. M. Cranton, C. B. Thomas, Appl. Sur. Sci., 166, 504 (2000) DOI ScienceOn |
24 | Y. Watanabe, Y. Matsumoto, H. Kunitomo, M. Tanamura and E. Nishimoto, Jpn. J. Appl. Phys., 9B, 5182 (1994) DOI |