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http://dx.doi.org/10.3740/MRSK.2005.15.11.711

Effects of Component Change of Bonding Materials on Field Emission Properties of CNT-Cathodes  

Shin Heo-Young (School of Materials Science and Engineering, Pusan National University)
Seong Myeong-Seok (School of Materials Science and Engineering, Pusan National University)
Kim Tae-Sik (School of Materials Science and Engineering, Pusan National University)
Oh Jeong-Seob (School of Materials Science and Engineering, Pusan National University)
Jung Seung-Jin (School of Materials Science and Engineering, Pusan National University)
Lee Ji-Eon (School of Materials Science and Engineering, Pusan National University)
Cho Young-Rae (School of Materials Science and Engineering, Pusan National University)
Publication Information
Korean Journal of Materials Research / v.15, no.11, 2005 , pp. 711-716 More about this Journal
Abstract
The effects of change in the component of bonding materials in carbon nanotube cathode (CNT-cathode) on field enhancement and field emission characteristics were investigated. The field enhancement factor$\beta$ was dependent on the electrical conductivity of the bonding materials. The use of frit glass as a bonding material showed a higher field enhancement factor and better field emission characteristics than an Ag paste. The reason for why the frit glass showed better field emission characteristics can be summarized as follows. First, a frit glass improves the real aspect ratio of CNTs compared to an Ag paste. Second, the number of CNTs in CNT-cathodes is considerably reduced because the CNTs were extensively oxidized during $390^{\circ}C$ heat treatment in air atmosphere in the case of Ag paste.
Keywords
Field enhancement factor; carbon nanotube; field emission; paste materials;
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1 J. M. Kim, W. B. Choi, N. S. Lee and J. E. Jung, Diamond Relat. Mater., 9, 1184 (2000)   DOI   ScienceOn
2 J. M. Bonard, J. P. Salvetat, T. Stockli and W. A. de Heer, Appl. Phys. Lett., 73, 918 (1998)   DOI   ScienceOn
3 Q. H. Wang, A. A. Setlur, J. M. Lauerhaas, J. Y. Dai, E. W. Seelig and R. P. H. Chang, Appl. Phys. Lett., 72, 2912 (1998)   DOI   ScienceOn
4 H. Y. Shin, W. S. Chung, K. H. Kim, Y. R. Cho, and B. C. Shin, To be published in J. Vac. Sci. Tech. B, 23(6), Nov/Dec (2005)   DOI   ScienceOn
5 S. L. Fang, A. M. Rao, P. C. Eklund, P. Nikolaev, A. G. Rinzler and R. E. Smalley, J. Mater. Res., 13, 2045 (1998)   DOI   ScienceOn
6 T. B. Massalski, Binary Alloys Phase Diagram, 2nd ed. edited by W. W. Scott, Jr. Vol. 1, p. 19, ASM International, Metals Park, OH, (1990)
7 J. P. Barbour, W. W. Dolan, J. K. Trolan, E. E. Martin, and W. P. Dyke, Phys. Rev., 92, 45 (1953)   DOI
8 J. W. Gadzuk, and E. W. Plummer, Rev. Mod. Phys., 45, 487 (1973)   DOI
9 A. N. Obraztsov, A. P. Volkov and l. Pavlovsky, Diamond Relat. Mater., 9, 1190 (2000)   DOI   ScienceOn
10 C. J. Lee, D. W. Kim, T. J. Lee, Y. C. Choi, Y. S. Park, W. S. Kim, W. B. Choi, N. S. Lee, J. M. Kim, Y. G. Choi, S. C. Yu, and Y. H. Lee, Appl. Phys. Lett., 75, 20 (1999)   DOI
11 W. S. Choi, H. Y. Shin, D. H. Kim, B. G. Ahn, W. S. Chung, D. G. Lee, and Y. R. Cho, Kor. J. Mater. Res., 13, 663 (2003)   과학기술학회마을   DOI
12 D. H. Kim, T. S. Kim, B. K. Ahn, H. Y. Shin, D. G. Lee, H. K. Cho, and Y. R. Cho, Materials Science Forums, 475-479, 1771 (2005)   DOI
13 A. Okamoto and H. Shinohara, Carbon, 43, 431 (2005)   DOI   ScienceOn
14 C. W. Chen, M. H. Lee and S. J. Clark, Appl. Surf. Sci., 228, 143 (2004)   DOI   ScienceOn
15 H. N. Lin, Y. H. Chang, J. H. Yen, J. H. Hsu, I. C. Leu, and M. H. Hon, Chem. Phys. Lett., 339, 422 (2004)   DOI   ScienceOn
16 Y. C. Choi, Y. M. Shin, S. C. Lim, D. J. Bae, Y. H. Lee and B. S. Lee, J. Appl. Phys., 88, 4898 (2000)   DOI   ScienceOn
17 D. H. Kim, H. S. Jang, C. D. Kim, D. S. Cho, H. D. Kang and H. R. Lee, Chem. Phys. Lett., 378, 232 (2003)   DOI   ScienceOn
18 Y. C. Choi, Y. M. Shin, D. J. Bae, S. C. Lim, Y. H. Lee and B. S. Lee, Diamond Relat. Mater., 10, 1457 (2001)   DOI   ScienceOn
19 L. Nilsson, O. Groening, C. Emrnenegger, O. Kuettel, E. Schaller and L. Schlapbach, Appl. Phys. Lett., 76, 2071 (2000)   DOI   ScienceOn