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http://dx.doi.org/10.3740/MRSK.2003.13.10.651

Ultrasonic Images Enhancement of the SS Reference Specimen and the Reference Calibration Block for NPPs by the Combining Bases of Support for Spatial Frequency  

Park, Chi-Seung (Division of Material Science and Engineering, Hanyang University)
Kim, Seon-Jin (Division of Material Science and Engineering, Hanyang University)
Publication Information
Korean Journal of Materials Research / v.13, no.10, 2003 , pp. 651-657 More about this Journal
Abstract
Ultrasonic microscope has been used to detect the defects on surface or inner solid. Conventionally, it has used at a single operating frequency. The resolution and quality of the measured images are determined by a characteristic of the transducer of the ultrasonic microscope. The conventional ultrasonic microscope has been used envelope detector to detect the amplitude of reflected signal, but the changes in amplitude is not sensitive enough for specimen with microstructure that in phase. In this paper, we have studied multi-frequency depth resolution enhancement with ultrasonic reflection microscope for the reflectors of a stainless steel reference specimen and a reference calibration block to be used as the material in nuclear power plants for ISI, PSI. Increased depth resolution can be obtained by taking two, three-dimensional images at more that one frequency and numerically combining the results. As results of the experiment, we could get enhanced images with the rate of contrast in proportion and high quality signal distribution for the image to the changing rate of depth for the reflectors of the two kinds of specimens.
Keywords
Scanning Ultrasonic Microscope; Multi-Frequency; Depth Resolution; Transducer; Spatial Frequency; Bases of Support; Enhanced Image; SS: Stainless Steel; ISI: In-Service Inspection; PSI: Pre-service Inspection.;
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