Growth and Characteristics of SrBi2Nb2O9 Thin Films for Memory Devices |
Gang, Dong-Hun
(Dept.of Materials Science, Korea University)
Choe, Hun-Sang (Dept.of Materials Science, Korea University) Lee, Jong-Han (Dept.of Materials Science, Korea University) Im, Geun-Sik (Dept.of Materials Science, Korea University) Jang, Yu-Min (Dept.of Materials Science, Korea University) Choe, In-Hun (Dept.of Materials Science, Korea University) |
1 |
/
DOI ScienceOn |
2 | 川合知二, 工業調査會, 235 (1996) |
3 | J.F. Scott and C.A. Paz de Araujo, Science 246, 1400 (1989) DOI ScienceOn |
4 | T. Mihara, H. Watanabe and C.A. Paz de Araujo, Jpn, J. Appl. Phy., 32, 4168 (1993) DOI |
5 | C.K. Kwok and S.B. Desu, J. Mater. Res., 8, 339 (1993) DOI |
6 | L.L. Boyer, N. Velasquez and J.T. Evans, Jpn. J. Appl. Phys., 36, 5799 (1997) DOI |
7 | O. Auciello, Integrated Ferroelectrics, 15, 211 (1997) DOI ScienceOn |
8 | H.M. Duiker, P.D. Cuchiaro and L.K. McMillan, Jpn. J. Appl. Phys., 68, 5783 (1990) DOI |
9 | B.H. Park, B.S. Kang, S.D. Bu and T.W. Noh, Nature, 401,682 (1999) DOI |
10 | C.A. Paz de Araujo, J.D. Cuchiaro, L.D. McMillan, M.C. Scott and J.F. Scott, Nature, 43, 627 (1995) DOI ScienceOn |
11 | U. Chon, G.C. Yi, and H.M. Jang, Appl. Phys. Lett., 78, N.5, 658 (2001) DOI ScienceOn |
12 | J.F. Scott, L. Kamnerdiner, M. Parris, S. Traynor, V. Ottanbachar, A. Shawbketh and W. C. Oliver, J. Appl. Phys., 64, 787 (1988) DOI |
13 | K. Watanabe, M. Tanaka, E. Sumitomo, K. Katori, H. Yagi and J.F. Scott, Appl. Phys. Lett., 73, 126 (1998) DOI ScienceOn |
14 | G.P. Choi, J.H. Park, C.H. Lee, I.D. Kim, and H.G. Kim, Mat. Lett, 45, 08 (2000) |
15 | H. Ishiwara, FED Journal, 7, 13 (1996) |
16 | J.T. Evans and R. Womack, IEEE J. Solid State Circuits, 23, 610 (1998) |