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http://dx.doi.org/10.4283/JKMS.2017.27.1.030

Angular Dependence of Exchange Bias in NiFe/MnIr Bilayers  

Yoon, Seok Soo (Department of Physics, Andong National University)
Kim, Dong Young (Department of Physics, Andong National University)
Abstract
In this report, we calculated the angular dependence of exchange bias ($H_{ex}$) by using single domain model in exchange coupled ferromagnetic (F)/antiferromagnetic (AF) bilayers, which results with AF thickness ($t_{AF}$) were used for the analysis of measured ones in NiFe/MnIr bilayers. Angular dependence of $H_{ex}$ calculated at $t_{AF}$ > $t_c$ showed typical unidirectional behaviors, however, calculated one at $0.5t_c$ < $t_{AF}$ < $t_c$ showed peculiar angular behaviors by fixed AF spins at specified angle near ${\theta}_H=90^{\circ}$. Angular dependence of $H_{ex}$ measured in NiFe/MnIr (20 nm) bilayers showed typical unidirectional behaviors. However, measured one in NiFe/MnIr (4 nm) bilayers showed mixed behaviors including both of unidirectional and peculiar angular behaviors, which was explained by the grain size distribution of polycrystalline MnIr.
Keywords
exchange bias; antiferromagnetic; single domain model; critical thickness; grain size;
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