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http://dx.doi.org/10.4283/JKMS.2015.25.6.180

Study on Magnetization Reversal Behavior in Ferromagnetic Co0.5Fe0.5 Alloy Films  

Ryu, Kwang-Su (Department of Physics Education, Korea National University of Education)
Abstract
We have investigated the magnetization reversal behavior in ferromagnetic $Co_{0.5}Fe_{0.5}$ alloy films using the magneto-optical Kerr microscope capable of the direct observation of time-resolved domain patterns. Interestingly enough, as the sample thickness increases the magnetization reversal behavior becomes changed from a single domain wall motion to the random nucleations of domains. Also, from the stochastic analysis of the domain jump sizes during the domain wall motion, it was found that the magnetization reversal behavior in the samples shows the critical scaling behavior with the critical exponent of ${\tau}{\sim}1.33$.
Keywords
magnetization reversal; domain wall dynamics; critical scaling behavior; ferromagnetic film;
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1 P. Grunberg, Phys. Today 54, 31 (2001).
2 S.-B. Choe and S.-C. Shin, Phys. Rev. Lett. 86, 532 (2001).   DOI
3 K.-S. Ryu, K.-D. Lee, S.-B. Choe, and S.-C. Shin, J. Appl. Phys. 95, 7306 (2004).   DOI
4 D.-H. Kim, S.-B. Choe, and S.-C. Shin, Phys. Rev. Lett. 90, 087203 (2003).   DOI
5 K.-S. Ryu, H. Akinaga, and S.-C. Shin, Nat. Phys. 3, 547 (2007).   DOI
6 M. Speckmann, H. P. Oepen, and H. Ibach, Phys. Rev. Lett. 75, 2035 (1995).   DOI
7 S.-B. Choe and S.-C. Shin, J. Appl. Phys. 8, 3096 (2000).
8 H.-S. Lee, K.-S. Ryu, K.-R. Jeon, S. S. P. Parkin, and S.-C. Shin, Phys. Rev. B 83, 060410(R) (2011).   DOI
9 H.-S. Lee, K.-S. Ryu, C.-Y. You, K.-R. Jeon, S. S. P. Parkin, and S.-C. Shin, New J. Phys. 13, 083038 (2011).   DOI
10 S.-B. Choe, D.-H. Kim, Y.-C. Cho, H.-J. Jang, K.-S. Ryu, H.-S. Lee, and S.-C. Shin, Rev. Sci. Instrum. 73, 2910 (2002).   DOI
11 H.-S. Lee, K.-S. Ryu, I.-S. Kang, and S.-C. Shin, J. Appl. Phys. 109, 07E101 (2011).   DOI
12 P. Cizeau, C. Zapperi, G. Durin, and H. E. Stanley, Phys. Rev. Lett. 79, 4669 (1997).   DOI