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http://dx.doi.org/10.4283/JKMS.2013.23.2.037

Thickness Dependence of Ferromagnetic Resonance Properties in NiFe Thin Films  

Kim, Dong Young (Department of Physics, Andong National University)
Yoon, Seok Soo (Department of Physics, Andong National University)
Abstract
The out-of-plane and in-plane angular dependence of ferromagnetic resonance field was measured in NiFe thin films fabricated by magnetron sputtering. The effective magnetization was obtained from the out-of-plane angular dependence of ferromagnetic resonance field, which was well agreed with calculated one. The decrease of effective magnetization with NiFe thickness was due to the surface anisotropy constant of $K_s=-0.23\;erg/cm^2$. The in-plane uniaxial anisotropy fields were obtained from the in-plane angular dependence of ferromagnetic resonance field. The easy axis of in-plane uniaxial anisotropy field was rotated to the reverse direction of applied magnetic field during sample fabrication, which was explained by the antiferromagnetic NiFeO layer at sample surface.
Keywords
ferromagnetic resonance; effective magnetization; surface anisotropy; uniaxial anisotropy;
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