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http://dx.doi.org/10.4283/JKMS.2009.19.5.176

Study on Barkhausen Avalanches in Fe Thin Film  

Lee, Hun-Sung (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology (KAIST))
Ryu, Kwang-Su (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology (KAIST))
Shin, Sung-Chul (Department of Physics and Center for Nanospinics of Spintronic Materials, Korea Advanced Institute of Science and Technology (KAIST))
Kang, Im-Seok (Korea Science Academy)
Abstract
We report a direct observation of Barkhausen avalanches in 50-nm Fe film, using a magneto-optical microscope magnetometer, capable of time-resolved domain observation. The time-resolved domain-evolution patterns exhibit that the occurrence of Barkhausen jump is random with respect to interval, size, and location. From the repetitive measurements more than 1000 times, we found that the probability distribution of Barkhausen jump size follows a power-law distribution and the critical exponent reveals the value of 1.14 $\pm$ 0.03.
Keywords
Barkhausen avalanches; critical scaling behavior; critical exponent; power-law distribution;
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