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http://dx.doi.org/10.4283/JKMS.2005.15.5.265

Exchange Bias Study by FMR Measurment  

Yoo, Yong-Goo (Electronics and Telecommunications Research Institute)
Park, Nam-Seok (Department of Electrical and Electronic engineering, Chungju National University)
Min, Seong-Gi (Department of Physics, Chungbuk National University)
Yu, Seong-Cho (Department of Physics, Chungbuk National University)
Publication Information
Journal of the Korean Magnetics Society / v.15, no.5, 2005 , pp. 265-269 More about this Journal
Abstract
Exchange bias effect of a various layered thin films were studied by FMR measurment. In plane angular dependence of a resonance field distribution which measured by FMR was analysed as a combined effect of an unidirectional anisotropy and an uniaxial anisotropy. Exchange biased NiFe/IrMn, IrMn/NiFe/IrMn, and NiFe/IrMn/CoFe thin films showed larger unidirectional anisotropy field and uniaxial anisotropy field with compared to that of an unbiased NiFe single thin film. In case of NiFe/Cu/IrMn, the film with thick Cu layer exhibited a similar trend to the unbiased NiFe thin film. NiFe/IrMn/CoFe thin film showed two resonance field distribution due to different ferromagnetic layers. In additon to the resonance field, the line width was also analysed with related to exchange bias effect.
Keywords
exchange bias; ferromagnetic resonance; unidirectional anisotropy field and uniaxial anisotropy;
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