Browse > Article
http://dx.doi.org/10.4283/JKMS.2005.15.2.072

Measurement of Saturation Magnetostriction by the Second-order Higher Harmonics of ac Perturbing Magnetic Field  

Cha, S.Y. (POSCO Technical Research Laboratories)
Kim, J.K. (POSCO Technical Research Laboratories)
Ryu, K.S. (School of Materials Science and Engineering, Pusan National University)
Cho, Y.R. (Korea Res. Ins. Stand. Sci.)
Publication Information
Journal of the Korean Magnetics Society / v.15, no.2, 2005 , pp. 72-75 More about this Journal
Abstract
The profiles of the second-order higher harmonics during B-H hysteresis loop have been measured as functions of the tensile stress in grain-oriented $3.2{\%}$ Si steels. The observed harmonics profiles have been analyzed in terms of the nonlinear, asymmetric magnetization which reflects the domain reorientation under the field. The field interval of the second-order higher harmonics is related to the nucleation and annihilation fields and a measurement method for the magnetostriction is proposed using the harmonics profiles under tensile stress.
Keywords
second-order higher harmonics; tensile stress; harmonics profile; asymmetric magnetization;
Citations & Related Records
연도 인용수 순위
  • Reference
1 H. C. Kim, D. Y. Kim, and C. G. Kim, J. Mater. Sci., 29, 4431(1992)   DOI
2 C. W. Chen, Magnetism and metallurgy of soft magnetic materials, North-Holland Publ. Co. (1977), pp. 123
3 H. Negishi, H. Takahashi, and M. Inoue, JMMM, 68, 271(1987)   DOI   ScienceOn
4 황도근, 김호철, 응용물리, 5(3), 280(1992)
5 R. Boll, K. J. Overshott, Magnetic Sensors, VCH, Weinheim (1989), pp. 36-38
6 Etienne du Tremolet de Lacheisserie, Magnetostriction, CRC Press, Baca Raton (1993), pp. 330
7 S. Breen, B. E. Paton, B. L. Blackford, and M. H. Jercho, Appl. Opt., 29, 16(1990)   DOI
8 R. Boll and K. J. Overshott, Magnetic Sensors, VCH, Weinheim (1989), pp. 269-278
9 C. G. Kim, H. C. Kim, and K. Haga, J. Phys. D: Appl. Phys., 23, 1436(1990)   DOI   ScienceOn
10 K. Kadowaki, JMMM, 79, 358(1989)   DOI   ScienceOn
11 K. Narita, J. Yamasaki, and H. Fukunaga, IEEE Trans. Mag., 16, 435(1980)   DOI
12 H. Kronmuller, K. D. Durst, and M. Sagawa, JMMM, 74, 291(1988)   DOI   ScienceOn
13 A. Garcia-Arribas, J. M. Barandiaran, and G. Herzer, J. Appl. Phys., 71, 3047(1992)   DOI
14 P. Sanchez, E. Lopez, M. C. Sanchez, and C. Aroca, IEEE Trans. Mag., 26, 1139(1990)   DOI   ScienceOn
15 C. G. Kim, H. C. Kim, D. Y. Kim, K. H. Lee, and D. G. Hwang, Phys. Stat. Sol (a), 151, 397(1995)   DOI   ScienceOn
16 D. G. Hwang, C. G. Kim, K. H. Lee, and H. C. Kim, JMMM, 125, 129(1993)   DOI   ScienceOn
17 J. M. Barandiaran, M. Vazquez, J. Gonzalez, and G. Rivero, IEEE Trans. Magn., 25, 3330(1989)   DOI   ScienceOn
18 B. K. Middleton, IEEE Trans. Magn., 10, 931(1974)   DOI
19 A. Aharoni, Revs. Modern Phys., 34, 227(1962)   DOI
20 J. W. Shilling and G. L. Houze, JR., IEEE Trans. Magn., 10, 195(1974)   DOI