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http://dx.doi.org/10.4283/JKMS.2004.14.2.059

Soft Magnetic Property Analysis of Nanocrystalline Fe-Al-O Film with the Change of Microstructure  

Lee, Young-Woo (충남대학교 신소재공학부)
Park, Bum-Chan (충남대학교 신소재공학)
Kim, Chong-Oh (충남대학교 신소재공학)
Moon, Ji-Hyun (충남대학교 물리학)
Choi, Yong-Dae (목원대학교 광전자물리학과)
Abstract
We investigated the soft magnetic properties of nanocrystalline Fe-Al-O film as etching the oxide film with ion beam etching method. It is thought that the grain size of Fe-Al-O film increases as the thickness decreases. The coercivity and squareness increase with decreasing thickness. The surface curvature of Am images increases when the etching experiment proceeds. This phenomena could be due to the grain growth which occurs during sputtering. This grain growth could be assisted by the the plasma energy during sputtering. Therefore proper thickness should be searched to acquire the good soft magnetic properties for the nanocrystalline film material. Good soft magnetic properties of Fe-Al-O film was acquired at the thickness of more than 900 nm.
Keywords
Fe-Al-O; nanocrystalline soft magnetic material; random anisotropy model; grain size;
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