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http://dx.doi.org/10.4283/JKMS.2003.13.5.211

Microstructure and Exchange Coupling in Synthetic Ferrimagnetic Permalloy/ Ru (V)/Permalloy Films  

Jung, Young-Soon (서울시립대학교 신소재공학과)
Song, Oh-Sung (서울시립대학교 신소재공학과)
Yoon, Chong-Seung (한양대학교 신소재공학부)
Abstract
We fabricated the synthetic ferrimagnetic layers (SyFL) of permalloy/X (X=Ru, V)/permalloy by varying the X thickness, and investigated the changes of coercivity (H$\sub$c/), spin flopping field (H$\sub$sf/), and saturation magnetization field (H$\sub$s/) with a superconducting quantum interference device (SQUID). We also observed the microstructure with a cross sectional transmission electron microscope (TEM). Permalloy SyFL had less than 10 Oe coercivity, and H$\sub$sf/ and H$\sub$s/ could be tuned by varying ruthenium and vanadium layer thickness. The comparatively small exchange coupling in permalloy-V SyFL was caused by the intermixing of permalloy and vanadium decreasing the effective exchange coupling thickness.
Keywords
synthetic ferrimagnetic layers; ruthenium; vanadium; permalloy; exchange coupling;
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