Interface study of ion irradiated Cu/Ni/Cu(001)/Si thin film by X-ray reflectivity
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Kim, T.G.
(Advanced Analysis Center, KIST)
Song, J.H. (Advanced Analysis Center, KIST) Lee, T.H. (Material Science and Technology Division, KIST) Chae, K.H. (Material Science and Technology Division, KIST) Hwang, H.M. (Atomic-scale Surface Science Research Center and IPAP, Yonsei University) Jeon, G.Y. (Atomic-scale Surface Science Research Center and IPAP, Yonsei University) Lee, J (Atomic-scale Surface Science Research Center and IPAP, Yonsei University) Jeong, K. (Atomic-scale Surface Science Research Center and IPAP, Yonsei University) Whang, C.N. (Atomic-scale Surface Science Research Center and IPAP, Yonsei University) Lee, J.S. (Department of Physics, Pohang University of Science and Technology) Lee, K.B. (Department of Physics, Pohang University of Science and Technology) |
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