1 |
Hawkes, P. W. and Kasper, E., 1989, Principles of Electron Optics, Academic press, UK
|
2 |
Mariusz, P., Andrzej, C., Jacek, R., Jerzy, K., Lukasz, O., and Remigusz, R., 2008, "Seperation of imagedistortion sources and magnetic-field measurement in scanning electron microscope(SEM)," Micron, pp. 1-5
|
3 |
Fritz, J. H., 1986, "Background and application of electron beam test techniques," Vol. 4, pp. 139-157
|
4 |
2006, Design Specification for a 30 kV Electron Gun Power Supply, Spellman, UK
|
5 |
Joseph, I. G., Dale, E. N., Patrick, E., David. C. J., Roming. A. D., Charles. E. L., Charles, F., and Eric. L., 1992, Scanning Electron Microscopy and X-Ray Microanalysis, Plenum Press, USA, pp. 21-272
|
6 |
Sunjong, L. and Chanhong, L., 2006, "Design of Control Signal Systemization for SEM," KSMTE, pp. 97-100
|
7 |
Sunjong, L. and Chanhong, L., 2007, "Hardware Design for the Control Signal Generation of Electron Optic by Focal Length," KSMTE, Vol. 16, No. 5, pp. 96-100
과학기술학회마을
|
8 |
John, T. L., 1993, ELECTRON BEAM TESTING TECHNOLOGY, Plenum Press, USA, pp. 129-147
|