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Non-Destructive Evaluation for Material of Thermal Barrier Coatings  

Lee Chul-Ku (서울산업대학교 생산공학부 기계공학과)
Kim Tae-Hyung (서울산업대학교 산업대학원)
Publication Information
Transactions of the Korean Society of Machine Tool Engineers / v.14, no.1, 2005 , pp. 44-51 More about this Journal
Abstract
Material degradation is a multibillion-dollar problem which affects all the industries amongst others. The last decades have seen the development of newer and more effective techniques such as Focused-ion beam(FIB), Transmission electron microscopy(TEM), Secondary-ion mass spectroscopy(SIMS), auger electron spectroscopy(AES), X-ray Photoelectron spectroscopy(XPS) , Electrochemical impedance spectroscopy(EIS), Photo- stimulated luminescence spectroscopy(PSLS), etc. to study various forms of material degradation. These techniques are now used routinely to obtain information on the chemical state, depth profiling, composition, stress state, etc. to understand the degradation behavior. This paper describes the use of these techniques specifically applied to materials degradation and failure analysis.
Keywords
Transmission electron microscopy(TEM); X-ray Photoelectron spectroscopy(SPS); Non-destructive evaluation(NDE); Thermal barrier coatings(TBCs);
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