1 |
Venet, P., Perisse, F., El-Hussein, M. H., Rojat, G., 2002, Realization of a Smart Electrolytic Capacitor Circuit, IEEE Industry Applications Magazine, 51:1 16-20.
|
2 |
Shon, J., 2009, A Characteristic Analysis and Capacitance Estimation Algorithm of Electrolytic Capacitor for Non-linear Loads, The Journal of Korean Institute of Intelligent Transport Systems, 8:6 180-186.
|
3 |
Yum, B. J., Kim, S. H., 1990, Development of Life-Test Sampling Plans for Exponential Distribution Based on Accelerated Life Testing, Communications in Statistics-Theory and Methods, 17 2735-2743.
|
4 |
Tyoskin, O., Krivolapov, S., 1996, Non-parametric Model for Steptress Accelerated Life Testing, IEEE Transactions on Reliability, 45:2 346-350.
DOI
|
5 |
Nelson, W., Meeker, W. Q., 1987, Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions, Technometrics, 20:2 171-177.
DOI
|
6 |
Nelson, W., 1990, Accelerated Testing: Statistical Models, Test Plans, and Data Analyses, New York, John Wiley.
|
7 |
Bai, D. S., Chung S. W., 1991, An Optimal Design of Accelerated Life Test for Exponential Distribution, Reliability Engineering & System Safety, 31:1 57-64.
DOI
|
8 |
Yu, H. F., Tseng, S. T., 2002, Designing a Screening Experiment for Highly Reliable Products, Naval Research Logistics, 49:5 514-526.
DOI
|
9 |
Yu, H. F., 2002, Optimal Selection of the Most Reliable Product with Degradation Data, Engineering Optimization, 34:6 579-590.
DOI
|