1 |
Maeng, H. Y., Kim, S. G., 2005, Design and Modal Analysis of FIB-SEM Compound Machine Structure, KSMTE, 2005:10 14-19.
|
2 |
Kim, Y. T., 2008, Design and Optimization of Ion Beam Optics for Multi Ion Beam Instrument, A Thesis for a Master, Yonsei University, Republic of Korea.
|
3 |
Ko, Y. H., 2006, A Study on the Assembly Aberration Analysis of Focused Ion Beam Column, A Thesis for a Master, Korea Polytechnic University Republic of Korea.
|
4 |
Kim, H. S., Kim, D. W., 2003, Electro - optical Analysis of a Miniaturized Electrostatic Electron lens, OSK, 14:2 194-199.
|
5 |
Lee, S. S., Her, j., 2008, Characteristic of Breakdown Voltage of Electrode Material in Vacuum, KIEE, 2008:10 101-102.
|
6 |
Miyazaki, F., Inagawa, Y., 2005, Electrode Conditioning Characteristics in Vacuum under Impulse Voltage Application in Non-uniform Electric Field, IEEE, 12:1 17-23.
|
7 |
Yoon, J. D., Yang, C. W., 2005, Scanning Electron Microscopy Analysis and X-ray Microanalysis, Cheongmoongak, Republic of Korea.
|
8 |
Goldstein, J., Newbury, D., 1989, Scanning Electron Microscopy and X-ray Microanalysis, Plenum press, USA.
|
9 |
Lee, R. E., 1993, Scanning Electron Microscopy and X-ray Microanalysis, PTR Prentice Hall, USA.
|
10 |
Kim, K. H., Jang, D. Y., 2013, Observation of the Machined Surface Roughness through SEM, an Electrostatic Type, KSPE, 2013:5 1587-1588.
|