Browse > Article
http://dx.doi.org/10.7840/kics.2017.42.2.345

MTTDL for Distributed Storage Systems with Dual Node Repair Capability  

Kil, Yong Sung (College of Information and Communication Engineering, Sungkyunkwan University)
Kim, Sang-Hyo (College of Information and Communication Engineering, Sungkyunkwan University)
Park, Hosung (School of Electronics and Computer Engineering, Chonnam National University)
Abstract
MTTDL, a measure for reliability of distributed storage system, is analyzed for the case when double node repair is possible and compared with the single node repair cases.
Keywords
distributed storage systems; reliability analysis;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 P. Gopalan, C. Huang, H. Simitci, and S. Yekhanin, "On the locality of codeword symbols," IEEE Trans. Inf. Theory, vol. 58, no. 11, pp. 6925-6934, Nov. 2012.   DOI
2 M.-Y. Nam and H.-Y. Song, "Constructions for optimal binary locally repairable codes," J. KICS, vol. 41, no. 10, pp. 1176-1178, Oct. 2016.   DOI
3 S. Ramabhadran and J. Pasquale, "Analysis of long-running replicated systems," in Proc. IEEE INFOCOM, pp. 1-9, Barcelona, Spain, Apr. 2006.
4 M. Shahabinejad, M. Khabbazian, and M. Ardakani, "A class of binary locally repairable codes," IEEE Trans. Commun., vol. 64, no. 8, pp. 3182-3193, Aug. 2016.   DOI
5 R. Bhagwan, K. Tati, Y.-C. Cheng, S. Savage, and G. M. Voelker, "Total recall: System support for automated availability management," in Proc. NSDI, pp. 337-350, CA, USA, Mar. 2004.