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Matching-based Advanced Integrated Diagnosis Method  

Lim, Yo-Seop (연세대학교 전기전자공학과 컴퓨터시스템 및 관련 SoC 연구실)
Kang, Sung-Ho (연세대학교 전기전자공학과 컴퓨터시스템 및 관련 SoC 연구실)
Publication Information
The Journal of Korean Institute of Communications and Information Sciences / v.32, no.4A, 2007 , pp. 379-386 More about this Journal
Abstract
In this paper, we propose an efficient diagnosis algorithm for multiple stuck-at faults. Because of using vectorwise intersections as an important metric of diagnosis, the proposed diagnosis algorithm can diagnose multiple defects in single stuck-at fault simulator. In spite of multiple fault diagnosis, the number of candidate faults is drastically reduced. For identifying faults, the variable weight, positive calculations and negative calculations are used for the matching algorithm. To verify our algorithm, experiments were performed for ISCAS85 and full-scan version of ISCAS89 benchmark circuits.
Keywords
Matching Algorithm; Diagnosis; Fault Simulation; Multiple Stuck-At Faults;
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