Browse > Article

Complex Dielectric Constant Measurements for Conductor-Loaded Composite Materials Using Genetic Algorithms  

Lee, Sang-Il (목포대학교 정보공학부 초고주파공학 연구실)
Publication Information
The Journal of Korean Institute of Communications and Information Sciences / v.30, no.2C, 2005 , pp. 10-15 More about this Journal
Abstract
In this paper, a simple but fast and reliable technique for the complex dielectric constant measurement of non-magnetic materials is introduced using a measured transmission coefficient (S21) and a genetic algorithm as an inversion process at microwave frequencies. In this experiment, it has been found that the transmission method is less susceptible with the measurement errors than that of the reflection method and the genetic algorithm can be efficiently used as a search technique. The suggested technique is validated with known and unknown conductor-loaded lossy materials and the conductor-loaded PCB at X-band.
Keywords
Complex permittivity(dielectric constant) measurement; S-parameters; Transmission method; Genetic algorithms; Conductor-loaded composite materials;
Citations & Related Records
연도 인용수 순위
  • Reference
1 A. Ishimaru, Electromagnetic Wave Propagation, Radiation, and Scattering, Prentice-Hall, N J, 1991
2 S. Lee and Y. Kuga, 'High permittivity dielectric composite materials,' 2001 IEEE AP-S International Symposium/URSI, July 8-13 2001, Boston, MA
3 W. T. Doyle and I. S. Jacobs, 'Effective cluster model of dielectric enhancement in metal-insulator composites,' J. of Physical Review B, 42, no. 15, 1990
4 A. M. Nicolson, and G. F. Ross 'Measurement of the intrinsic properties of materials time domain techniques,' IEEE Trans. IM-19, no. 4, pp. 377-382, September 1995
5 W. B. Weir, 'Automatic measurement of complex dielectric constant and permeability at microwave frequencies,' Proceedings of the IEEE, vol. 62, no. 1, pp. 33-36, January, 1974   DOI   ScienceOn
6 D. E. Goldberg, Genetic Algorithms in Search, Optimization, and Machine Learning, Addison Wesley Publishing Company, Inc. 1989
7 Hewlett Packard Product Note No. 8510-3
8 J. Baker-Jarvis and E.J. Vanzura, 'Improved Technique for Determining complex Per-mittivity with the transmission/Reflection Method,' IEEE Trans. MTT-38, pp.1096-1101, August 1990
9 J. Musil and F. Zacek, Microwave Measurements of Complex Permittivity by Free space methods and Their Applications, Elsevier, 1986