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Software Reliability Growth Model with the Testing Effort for Large System  

Lee Jae-ki (한국전자통신연구원 BcN시험기술팀)
Lee Jae-jeong (한국전자통신연구원 BcN시험기술팀)
Nam Sang-sik (한국전자통신연구원 BcN시험기술팀)
Abstract
Most of the proposed SRGMs are required to perfect debugging based on removal of defect as soon as the detection of defects in system tests. But the detected defects are corrected after few days as a fixed time or induced new fault in software under the imperfect debugging environments. Solving these problems, we discussed that the formal software reliability model considered testing-effort for the fault detection and correction of software defects, and then using this model we have estimated of the software reliability closed to practical conditions.
Keywords
SRGM; test-effort; NHPP;
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