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VBIC Model Application and Parameter Extraction and Optimization for SiGe HBT  

Lee, Sang-Heung (SiGe Device Team, Electronics and Telecommunication Research Institute)
Park, Chan-Woo (Basic Research Division, Electronics and Telecommunication Research Institute)
Lee, Seung-Yun (SiGe Device Team, Electronics and Telecommunication Research Institute)
Lee, Ja-Yol (SiGe Device Team, Electronics and Telecommunication Research Institute)
Kang, Jin-Yeong (SiGe Device Team, Electronics and Telecommunication Research Institute)
Abstract
In 1995, a group of representatives from the integrated circuits and computer-aided design industries presented a industry standard bipolar model called the VBIC model. The VBIC model includes the improved Early effect, quasi-saturation, substrate parasitic, avalanche multiplication, and self-heating which are not available in the conventional SGP model. This paper applies VBIC model for SiGe HBT device and develops an accurate and efficient methodology to extract all the DC and AC parameters of the VBIC model for SiGe HBT device at room temperature. Simulated results by the extracted VBIC model parameter are compared with the measurement data and show very good agreement in both DC and s-parameters prediction.
Keywords
VBIC eummel-Poon; SiGe HBT; Parameter extraction; Parameter optimization.;
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  • Reference
1 VBIC95: An improved bipolar transistor molel /
[ F.Najm ] / IEEE Circuits and Devices Magazine
2 SPICE Early modeling /
[ C.C.McAndrew;L.W.Nagel ] / Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting
3 An integrated charge-control model of bipolar transistors /
[ H.K.Gummel;H.C.Poon ] / Bell System Tech. J.
4 /
[ SILVACO International ] / UTMOST(universal Transistor MOdeling SofTware) Ⅲ
5 Parameter extraction and optimization for new industry atand VBIC model /
[ X.Cao;J.McMacken;P.Layman;J.J.Liou;A.Sun;S.Moinian ] / International Conference on Advanced Semiconductor Devices and Microsystems
6 VBIC95: An imroved vertical, IC bipolar transistor model /
[ C.C.McAndrew;J.A.Seitchik;D.F.Bowers;M.Dunn;M.Foisy;I.Getru;M.McSwain;S.Moinian;J.Parker;P. van Wihnen;L.F.Wagner ] / Proceedings of IEEE Bipolar/BiCMOS Circuits and Technology Meeting
7 The behavior of Ti silicidation on Si/SiGe/Si base and its effect on base resistance and fmax in SiGe hetero-junction bipolar transistors /
[ S.Y.Lee;H.S.Kim;S.H.Lee;K.H.Shim;J.Y.Kang;M.K.Song ] / Journal of Materials Science: Materials in Electronics   ScienceOn