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http://dx.doi.org/10.5351/KJAS.2014.27.1.115

A Test for Randomness of the Binary Random Sequence  

Yeo, In-Kwon (Department of Statistics, Sookmyung Women's University)
Publication Information
The Korean Journal of Applied Statistics / v.27, no.1, 2014 , pp. 115-122 More about this Journal
Abstract
A test for randomness of the binary random sequence is proposed in this paper. The proposed test statistic is based on the mean length of runs distributed with truncated geometric distribution and asymptotically ${\chi}^2_2$-distributed when the size of the sequences is large. A small Monte Carlo simulation compared the size of the test with a significant level as well as evaluated the test power. We applied the proposed method to the sequence of yes or no numbers in Lotto 6/45 and concluded that the randomness of Lotto is retained.
Keywords
Length of runs; Lotto 6/45; truncated geometric distribution;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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