RESIDUALS IN MINIMAL RESOLUTION IV DESIGNS |
Liau, Pen-Hwang (Department of Applied Mathematics, I-Shou University) |
1 |
Critical values of a test to detect outliers in factorial experiments
/
ScienceOn |
2 |
/
|
3 |
Locating outliers in factorial experiments
/
ScienceOn |
4 |
Resolution IV fractional factorial designs
/
|
5 |
/
|
6 |
Robust design : A cost-effective method for improving manufacturing process
/
|
7 |
/
|
8 |
Finding outliers in unreplicated factorial designs
/
|
9 |
Critical analysis of factorial experiments and orthogonal fractions
/
ScienceOn |
10 |
Pattern in residuals for 2ⁿ designs
/
ScienceOn |
11 |
Non-orthogonal designs of even resolution
/
ScienceOn |