Low Dropout Voltage Regulator Using 130 nm CMOS Technology |
Marufuzzaman, Mohammad
(Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia)
Reaz, Mamun Bin Ibne (Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia) Rahman, Labonnah Farzana (Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia) Mustafa, Norhaida Binti (Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia) Farayez, Araf (Department of Electrical, Electronic and Systems Engineering, Faculty of Engineering and Built Environment, Universiti Kebangsaan Malaysia) |
1 | M. Marufuzzaman, M.B.I. Reaz, and M.A.M. Ali, Proc. of the Int. Conf. on Computer Applications and Industrial Electronics (IEEE, Kuala Lumpur, Malaysia, 2010) p. 600-603. |
2 | S. Kumar, P. Jay, and R. Prasad, Int. J. Res. Eng. Technol. , 3, 2319 (2014). [DOI: http://dx.doi.org/10.15623/ijret.2014.0304168] |
3 | A. Saberkari, E. Alarcon, and S. B. Shokouhi, Integration, the VLSI Journal , 46, 165 (2013). [DOI: http://dx.doi.org/10.1016/j.vlsi.2012.02.001] DOI |
4 | L. F. Rahman, M.B.I. Reaz, M.A.M. Ali, and M. Marufuzzaman, Elektronika ir Elektrotechnika , 120, 113 (2012). [DOI: http://dx.doi.org/10.5755/j01.eee.120.4.1466] |
5 | W. Oh and B. Bakkaloglu, IEEE Transactions on Circuits and Systems, 54, 922 (2007). [DOI: http://dx.doi.org/10.1109/tcsii.2007.901621] DOI |
6 | R. J. Milliken, J. Silva-Martinez, and E. Sanchez-Sinencio, IEEE Trans. on Circuits and Systems I: Regular Papers , 54, 1879 (2007). [DOI: http://dx.doi.org/10.1109/TCSI.2007.902615] DOI |
7 | H. Martinez-Garcia, Proc. the 2014 IEEE Emerging Technology and Factory Automation (ETFA) (IEEE, Barcelona, Spain, 2014) p. 1. [DOI: http://dx.doi.org/10.1109/etfa.2014.7005343] |
8 | M. Kayal, F. Vaucher, and P. Deval, Proc. 2006 Proceedings of the 32nd European Solid-State Circuits Conference (IEEE, Montreux, Switzerland, 2006) p. 536-539. [DOI: http://dx.doi.org/10.1109/ESSCIR.2006.307508] |
9 | A. Hicham and H. Qjidaa, Proc. 2012 IEEE International Conference on Complex Systems (ICCS) (IEEE, Agadir, Morocco, 2012) p. 1-4. [DOI: http://dx.doi.org/10.1109/ICoCS.2012.6458540] |
10 | K. Kim, W. Park, D. Kim, J. Park, B. Song, and Y. Koo, Proc. TENCON 2012 IEEE Region 10 Conference (IEEE, Cebu, Philippines, 2012) p. 1-5. [DOI: http://dx.doi.org/10.1109/tencon.2012.6412315] |
11 | E. Abiri, M. R. Salehi, and S. Mohammadalinejadi, Proc. 2013 21st Iranian Conference on Electrical Engineering (ICEE) (IEEE, Mashhad, Iran, 2013) p. 1-5. [DOI: http://dx.doi.org/10.1109/IranianCEE.2013.6599866] |
12 | D. Dwibedy, S. Alapati, S. Patri, and K. Ksr, Proc. TENCON 2014 -2014 IEEE Region 10 Conference (IEEE, Bangkok, Thailand, 2014) p. 1-5. [DOI: http://dx.doi.org/10.1109/TENCON.2014.7022398] |
13 | S. R. Patri, S. Alapati, S. Chowdary, and K. Prasad, 18th Int. Symp. VLSI Des. Test (Coimbatore, 2014) p. 1-5. |
![]() |