1 |
A. W. Bett, F. Dimroth, G. Stollwerck, and O. V. Sulima, Appl. Phys., 69, 119 (1999). [DOI: https://doi.org/10.1007/s003390050983]
DOI
|
2 |
A. Natarajan, A. T. Kalghatgi, B. M. Bhat, and M. Satyam, J. Appl. Phys., 90, 6434 (2001). [DOI: https://doi.org/10.1063/1.1413943]
DOI
|
3 |
S. H. Kong, J. K. Wright, D. C. Nguyen, and R. L. Sheffield, Nucl. Instrum. Methods A, 272 (1995). [DOI: https://doi.org/10.1016/0168-9002(94)01425-6]
DOI
|
4 |
P. Michelato, Nucl. Instrum. Methods A, 393, 455 (1997). [DOI: https://doi.org/10.1016/S0168-9002(97)00545-7]
DOI
|
5 |
J.W.J. Verschuur, B. M. Oerle, G. J. Ernst, D. Bisro, and W. J. Witteman, Nucl. Instrum. Methods B, 139, 541 (1998). [DOI: https://doi.org/10.1016/S0168-583X(97)00953-1]
DOI
|
6 |
P. Sen, D. S. Pickard, J. E. Schneider, M. A. McCord, and R. F. Pease, J. Vac. Sci. Technol. B, 16, 3380 (1998). [DOI: https://doi.org/10.1116/1.590463]
DOI
|
7 |
T. L. Westover, A. D. Franklin, B. A. Cola, T. S. Fisher, and R. G. Reifenberger, J. Vac. Sci. Technol. B, 28, 423 (2010). [DOI: https://doi.org/10.1116/1.3368466]
DOI
|
8 |
S. Schubert, M. R. Oses, I. B. Zvi, T. Kamps, and X. Liang, APL. Mater., 1, 032119 (2013). [DOI: https://doi.org/10.1063/1.4821625]
DOI
|
9 |
H. S. Jeong, K. Keller, and B. Culkin, J. Vac. Sci. Technol. B, 33, 051213 (2015). [DOI: http://dx.doi.org/10.1116/1.4930301]
DOI
|
10 |
S. Donati, Photodetectors (Prentic Hall, Italy, 2000).
|