1 |
I. Poupyrev, S. Maruyama, and J. Rekimoto, Proc. UIST 2002 (Paris, France, 2002) P. 51. [DOI: https://doi.org/10.1145/571985.571993]
|
2 |
Y. K. Oh and J. H. Yoo, Mater. Lett., 79, 180 (2012). [DOI: https://doi.org/10.1016/j.matlet.2012.04.010]
DOI
|
3 |
J. R. Noh and J. H. Yoo, J. Electroceram, 30, 139 (2012). [DOI: https://doi.org/10.1007/s10832-012-9775-7]
|
4 |
M. H. Park and J. H. Yoo, J. Elec. Mater., 30, 3095 (2012). [DOI: https://doi.org/10.1007/s11664-012-2206-3]
|
5 |
I. T. Seo, T. G. Lee, D. H. Kim, J. Hur, J. H. Kim, S. Nahm, J. Ryu, and B. Y. Choi, Sensor. Actuat. A, 71, 238 (2016).
|
6 |
J. H. Kim, J. H. Kwon, J. S. Park, and K. J. Lim, J. Korean Inst. Electr. Electron. Mater. Eng., 28, 565 (2015). [DOI: https://doi.org/10.4313/JKEM.2015.28.9.565]
|