1 |
S. Suhaimi , M. M. Shahimin, Z. A. Alahmed, J. Chyský, and A. H. Reshak, Int. J. Electrochem. Sci., 10, 2859 (2015).
|
2 |
Z. Chen, W. Li, R. Li, Y. Zhang, G. Xu, and H. Cheng, Langmuir, 29, 13836 (2013). [DOI: https://doi.org/10.1021/la4033282]
DOI
|
3 |
H.-G. Yun, M. Kim, M. G. Kang, and I.-H. Lee, Phys. Chem. Chem. Phys., 14, 6448 (2012). [DOI: https://doi.org/10.1039/c2cp40205j]
DOI
|
4 |
N. Muslim, Y. W. Soon, C. M. Lim, and N. Y. Voo, ARPN J. Eng. Appl.Sci., 10, 7184 (2015).
|
5 |
K. Buijs, Stainless Steel World, 17, 1 (2005).
|
6 |
Y. M. Lu, W. S. Hwang, W. Y. Liu, and J. S. Yang , Mater. Chem. Phys., 72, 269. (2001). [DOI: https://doi.org/10.1016/S0254-0584(01)00450-3]
DOI
|
7 |
Y. L. Jeyachandran, B. Karunagaran, S. K. Narayandass, and D. Mangalaraj, Mat. Sci. Eng. A-Struct., 458, 361 (2007). [DOI: https://doi.org/10.1016/j.msea.2006.12.088]
DOI
|
8 |
K. Hofmann, B. Spangenberg, M. Luysberg, and H. Kurz, Thin Solid Films, 436, 168 (2003). [DOI: https://doi.org/10.1016/S0040-6090(03)00582-0]
DOI
|
9 |
S. Schiller, G. Beister, W. Sieber, G. Schirmer, and E. Hacker, Thin Solid Films, 83, 239 (1981). [DOI: https://doi.org/10.1016/0040-6090(81)90673-8]
DOI
|
10 |
S. Yun, P. D. Lund, and A. Hinsch, Energy Environ. Sci., 8, 3495 (2015). [DOI: https://doi.org/10.1039/C5EE02446C]
DOI
|
11 |
G. Kang, J. Choi, and T. Park, Sci. Rep., 6, 22987 (2016). [DOI: https://doi.org/10.1038/srep22987]
DOI
|
12 |
A. Grill, Surf. Coat. Technol., 94, 507 (1997). [DOI: https://doi.org/10.1016/S0257-8972(97)00458-1]
|
13 |
A. Czyzniewski, Thin Solid Films, 433, 180 (2003). [DOI: https://doi.org/10.1016/S0040-6090(03)00324-9]
DOI
|
14 |
L. J. Meng and M. P. dos Santos, Thin Solid Films, 226, 22 (1993). [DOI: https://doi.org/10.1016/0040-6090(93)90200-9]
DOI
|
15 |
L. Han, N. Koide, Y. Chiba, A. Islam, R. Komiya, N. Fuke, A. Fukui, and R. Yamanaka, Appl. Phys. Lett., 86, 213501 (2005). [DOI: https://doi.org/10.1063/1.1925773]
DOI
|
16 |
L. Han, N. Koide, Y. Chiba, and T. Mitate, Appl. Phys. Lett., 84, 2433 (2004).
DOI
|
17 |
M. Adachi, M. Sakamoto, J. Jiu, Y. Ogata, and S. Isoda, J. Phys. Chem. B, 110, 13872 (2006).
DOI
|