Browse > Article
http://dx.doi.org/10.4313/TEEM.2016.17.6.355

Solution-Derived Hafnium Lanthanum Oxide Films Prepared Using Ion-Beam Irradiation and Their Applications as Alignment Layers for Twisted-Nematic Liquid Crystal Displays  

Oh, Byeong-Yun (ZeSHTech Co., Ltd., Business Incubator, Gwangju Institute of Science and Technology)
Publication Information
Transactions on Electrical and Electronic Materials / v.17, no.6, 2016 , pp. 355-358 More about this Journal
Abstract
We present the alignment characteristics of LC (liquid crystal) molecules on solution-derived HLO (hafnium lanthanum oxide) films fabricated using IB (ion-beam) irradiation. We then demonstrated that LC molecules can be homogeneously and uniformly aligned on the HLO film irradiated at an IB incident energy of 1.2 keV. Physicochemical analysis methods such as atomic force microscopy and X-ray photoelectron spectroscopy were used to verify the LC alignment mechanism on the IB-irradiated HLO film. In addition, the electro-optical performance of a TN (twisted-nematic) cell fabricated using the IB-irradiated HLO film exhibited characteristics superior to those of the conventional TN cell fabricated using a rubbed polyimide layer.
Keywords
Liquid crystal alignment layer; Solution process; Hafnium lanthanum oxide; Ion-beam irradiation; Electro-optical properties;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
연도 인용수 순위
1 H. Wang, T. X. Wu, X. Zyu, and S. T. Wu, J. Appl. Phys., 95, 5502 (2004). [DOI: http://dx.doi.org/10.1063/1.1707210]   DOI
2 B. Y. Oh, K. M. Lee, B. Y. Kim, Y. H. Kim, J. W. Han, J. M. Han, S. K. Lee, and D. S. Seo, J. Appl. Phys., 104, 064502 (2008). [DOI: http://dx.doi.org/10.1063/1.2978364]   DOI
3 B. Y. Oh, Trans. Electr. Electron. Mater., 17, 109 (2016). [DOI: http://dx.doi.org/10.4313/TEEM.2016.17.2.109]   DOI
4 Y. J. Kim, Z. Zhuang, and J. S. Patel, Appl. Phys. Lett., 77, 513 (2000). [DOI: http://dx.doi.org/10.1063/1.127028]   DOI
5 J. M. Han and H. S. Hwang, Trans. Electr. Electron. Mater., 11, 285 (2010). [DOI: http://dx.doi.org/10.4313/TEEM.2010.11.6.285]   DOI
6 P. Chaudhari, J. Lacey, J. Doyle, E. Galligan, S.C.A. Lien, A. Callegary, G. Hougham, N. D. Lang, P. S. Andry, R. John, K. H. Yang, M. Lu, C. Cai, J. Speidell, S. Purushothaman, J. Ritsko, M. Samant, J. Stohr, Y. Nakagawa, Y. Katoh, Y. Saitoh, K. Sakai, H. Satoh, S. Odahara, H. Nakano, J. Nakagaki, and Y. Shiota, Nature, 411, 56 (2001). [DOI: http://dx.doi.org/10.1038/35075021]   DOI
7 J. Stohr, M. G. Samant, J. Luning, A. C. Callegari, P. Chaudhari, J. P. Doyle, J. A. Lacey, S. A. Lien, S. Purushothaman, and J. L. Speidell, Science, 292, 2299 (2001). [DOI: http://dx.doi.org/10.1126/science.1059866]   DOI
8 M. Schadt, H. Seiberle, and A. Schuster, Nature, 381, 212 (1996). [DOI: http://dx.doi.org/10.1038/381212a0]   DOI
9 K. Usami, K. Sakamoto, and S. Ushioda, J. Appl. Phys., 93, 9523 (2003). [DOI: http://dx.doi.org/10.1063/1.1572548]   DOI
10 O. Yaroshchuk and Y. Reznikov, J. Mater Chem., 22, 286 (2012). [DOI: http://dx.doi.org/10.1039/C1JM13485J]   DOI
11 H. G. Park, J. J. Lee, K. Y. Dong, B. Y. Oh, Y. H. Kim, H. Y. Jeong, B. K. Ju, and D. S. Seo, Soft Matter, 7, 5610 (2011). [DOI: http://dx.doi.org/10.1039/C1SM05083D]   DOI
12 J. L. Janning, Appl. Phys. Lett., 21, 173 (1972). [DOI: http://dx.doi.org/10.1063/1.1654331]   DOI
13 J. J. Lee, J. J. Han, H. G. Park, D. H. Kim, S. U. Byun, and D. S. Seo, Opt. Mater., 35, 2658 (2013). [DOI: http://dx.doi.org/10.1016/j.optmat.2013.08.005]   DOI
14 H. G. Park, Y. H. Kim, B. Y. Oh, W. K. Lee, B. Y. Kim, D. S. Seo, and J. Y. Hwang, Appl. Phys. Lett., 93, 233507 (2008). [DOI: http://dx.doi.org/10.1063/1.3046728]   DOI
15 J. H. Lim, B. Y. Oh, W. K. Lee, K. M. Lee, H. J. Na, B. Y. Kim, D. S. Seo, J. M. Han, and J. Y. Hwang, Appl. Phys. Lett., 95, 123503 (2009). [DOI: http://dx.doi.org/10.1063/1.3232239]   DOI
16 J. W. Lee, H. G. Park, H. C. Jeong, S. B. Jang, T. K. Park, and D. S. Seo, Opt. Express, 22, 31396 (2014). [DOI: http://dx.doi.org/10.1364/OE.22.031396]   DOI
17 Y. G. Lee, H. G. Park, H. C. Jeong, J. H. Lee, G. S. Heo, and D. S. Seo, Opt. Express, 23, 17290 (2015). [DOI: http://dx.doi.org/10.1364/OE.23.017290]   DOI
18 S. Jeong, Y. G. Ha, J. Moon, A. Facchetti, and T. J. Marks, Adv. Mater., 22, 1346 (2010). [DOI: http://dx.doi.org/10.1002/adma.200902450]   DOI
19 R. Lin and J. A. Rogers, Nano Lett., 7, 1613 (2007). [DOI: http://dx.doi.org/10.1021/nl070559y]   DOI
20 W. J. Zhu, T. Tamagawa, M. Gibson, T. Furukawa, and T. P. Ma, IEEE Electron Device Lett., 23, 649 (2002). [DOI: http://dx.doi.org/10.1109/LED.2002.805000]   DOI
21 H. Y. Yu, M. F. Li, B. J. Cho, C. C. Yeo, M. S. Joo, D. L. Kwong, J. S. Pan, C. H. Ang, J. Z. Zheng, and S. Ramanathan, Appl. Phys. Lett., 81, 376 (2002). [DOI: http://dx.doi.org/10.1063/1.1492024]   DOI