1 |
J. H. Lee, H. C. Jeong, H. G. Park, and D. S. Seo, RSC Adv., 5, 54079 (2015). [DOI: http://dx.doi.org/10.1039/C5RA09337F]
DOI
|
2 |
S. Y. Kim, H. G. Park, M. J. Cho, H C. Jeong, and D. S. Seo, Liquid Crystals, 41, 940 (2014). [DOI: http://dx.doi.org/10.1080/02678292.2014.894207]
DOI
|
3 |
D. C. Woo, C. Y. Koo, H. C. Ma, and H. Y. Lee, Trans. Electr. Electron. Mater., 13, 241 (2012). [DOI: http://dx.doi.org/ 10.4313/TEEM.2012.13.5.241]
DOI
|
4 |
M. Leskela and M. Ritala, Thin Solid Films, 409, 138 (2002). [DOI: http://dx.doi.org/10.1016/S0040-6090(02)00117-7]
DOI
|
5 |
D. J. Cherniak, Phys. Chem. Minerals, 26, 156 (1998). [DOI: http://dx.doi.org/10.1007/s002690050172]
DOI
|
6 |
S. P. Keller and G. D. Pettit, Rhy. Rev., 121, 1639 (1961). [DOI: http://dx.doi.org/10.1103/PhysRev.121.1639]
DOI
|
7 |
S. Mathur, H. Shen, A. Leleckaite, A. Beganskiene, and A. Kareiva, Mater. Res. Bull., 40, 439 (2005). [DOI: http://dx.doi.org/10.1016/j.materresbull.2004.12.002]
DOI
|
8 |
J. Li, D. Stein, C. McMullan, D. Branton, M. J. Aziz, and J. A. Golovchenko, Nature, 412, 166 (2001). [DOI: http://dx.doi.org/10.1038/35084037]
DOI
|
9 |
J. J. Lee, H. G. Park, J. J. Han, D. H. Kim, and D. S. Seo, J. Mater. Chem. C, 1, 6824 (2013). [DOI: http://dx.doi.org/10.1039/C3TC31470G]
DOI
|
10 |
F. Yu, D. Yuan, X. Cheng, X. Duan, X. Wang, L. Kong, L. Wang, and Z. Li, Mater. Lett. 61 2322 (2007). [DOI: http://dx.doi.org/10.1016/j.matlet.2006.09.003]
DOI
|
11 |
K. Asakawa and S. Sugata, J. Vac. Sci. Technol. A, 4, 677 (1986). [DOI: http://dx.doi.org/10.1116/1.573831]
DOI
|
12 |
W. Zheng, C. H. Lu, and Y. C. Ye, Jpn. J. Appl. Phys., 47, 1651 (2008). [DOI: http://dx.doi.org/10.1143/JJAP.47.1651]
DOI
|
13 |
S. J. Kang, Y. Y. Noh, K. J. Baeg, J. Ghim, J. H. Park, D. Y. Kim, J. S. Kim, J. H. Park, and K. Cho, Appl. Phys. Lett., 92, 052107 (2008). [DOI: http://dx.doi.org/10.1063/1.2830694]
DOI
|
14 |
J. W. Lee, H. G. Park, H. C. Jeong, S. B. Jang, T. K. Park, and D. S. Seo, Opt. Express, 22, 31396 (2014). [DOI: http://dx.doi.org/10.1364/OE.22.031396]
DOI
|
15 |
H. C. Jeong, H. G. Park, J. Lee, D. S. Seo, and B. Y. Oh, J. Vac. Sci. Technol. A, 33, 061401 (2015). [DOI: http://dx.doi.org/10.1116/1.4926747]
DOI
|