Comparison of Partial Discharge Characteristics in SF6 Gas Under AC and DC |
Jo, Hyang-Eun
(Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University)
Wang, Guoming (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) Kim, Sun-Jae (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) Kil, Gyung-Suk (Department of Electrical and Electronics Engineering, Korea Maritime and Ocean University) |
1 | S. Meijer, E. Gulski, J. J. Smit, and A. Girodet, Proc. of the Conference on Electrical Insulation and Dielectric Phenomena (TX, Austin, 1999) p.424. |
2 | P. Bresesti, W. L. Kling, R. L. Hendriks, and R. Vailati, IEEE, Trans. Energy. Convers., 22, 37 (2007). [DOI: http://dx.doi.org/10.1109/TEC.2006.889624] DOI |
3 | R. Piccin, A. Mor, P. Morshuis, A. Girodet, and J. Smit, IEEE Trans. Dielectr. Electr. Insul., 22, 218 (2015). [DOI: http://dx.doi.org/10.1109/ TDEI. 2014.004711] DOI |
4 | U. Schichler, M. Kuschel, and J. Gorablenkow, Proc. of the 18th International Symposium on High Voltage Engineering (Seoul, Korea, 2013) p.2313. |
5 | A. Cavallini, G. C. Montanari, M. Tozzi, and X. L. Chen, IEEE Trans. Dielectr. Electr. Insul., 18, 275 (2011). [DOI: http://dx.doi.org/10.1109/TDEI. 2011.5704519] DOI |
6 | S. S. Win, S. Coenen, and S. Tenbohlen, Proc. of the 18th International Symposium on High Voltage Engineering (Seoul, Korea 2013) p.781. |
7 | S. M. Markalous, S. Tenbohlen, and K. Feser, IEEE Trans. Dielectr. Electr. Insul., 15, 1576 (2008). [DOI: http://dx.doi.org/10.1109/TDEI.2008.4712660] DOI |
8 | G. S. Kil, I. K. Kim, D. W. Park, S. Y. Choi, and C. Y. Park, Curr. Appl. Phys., 9, 296 (2009). [DOI: http://dx.doi.org/10.1016/j.cap.2008.01.018] DOI |
9 | J. Y. Shin, Y. S. Lee, and J. W. Hong, Trans. Electr. Electron. Mater., 14, 211 (2013). [DOI: http://dx.doi.org/10.4313/TEEM.2013.14.4. 211] DOI |
10 | J. Y. Shin, H. D. Park, J. Y. Lee, and J. W. Hong, Trans. Electr. Electron. Mater., 11, 42 (2010). [DOI: http://dx.doi.org/10.4313/TEEM.2010.11.1.042] DOI |
11 | A. Cavallini, A. Contin, G. C. Montanari, and F. Puletti, IEEE Trans. Dielectr. Electr. Insul., 10, 216 (2003). [DOI: http://dx.doi.org/10.1109/TDEI.2003.1194102] DOI |
12 | S. J. Kim, H. E. Jo, G. W. Jeong, G. S. Kil, and J. R. Jung, Proc. of the International Conference on Condition Monitoring and Diagnosis (Jeju, Korea) p.557. |