1 |
D. Li, Y. Xia, Adv. Mater., 16, 1151 (2004). [DOI: http://dx.doi.org/10.1002/adma.200400719].
DOI
ScienceOn
|
2 |
Y. Dzenis, Science, 304, 1917 (2004). [DOI: http://dx.doi.org/10.1126/science.1099074].
DOI
ScienceOn
|
3 |
W. J. Li, C. T. Laurencin, E. J. Caterson, R. S. Tuan, and F. K. Ko, J. Biomed. Mat. Res., 60, 613 (2003). [DOI: http://dx.doi.org/10.1002/jbm.10167].
DOI
ScienceOn
|
4 |
J. R. Kim, S. W. Choi, S. M. Jo, W. S. Lee, and B. C. Kim, J. Electrochem. Soc., 152, A295 (2005). [DOI: http://dx.doi.org/10.1149/1.1839531].
DOI
ScienceOn
|
5 |
J. K. Steach, J. E. Jonathan, E. Clark, and S. V. Olesik, J. Appl. Polym. Sci., 118, 405 (2010). [DOI: http://dx.doi.org/10.1002/app.31597].
DOI
ScienceOn
|
6 |
C. S. Sharma, A. Sharma, M. Madou, Langmuir, 26, 2219 (2010).
|
7 |
C. S. Sharma, R. Vasita, D. K. Upadhyay, A. Sharma, D. S. Katti and R. Venkataraghavan, Ind. Eng. Chem. Res., 49, 2731 (2010). [DOI: http://dx.doi.org/10.1021/ie901312j].
DOI
ScienceOn
|
8 |
Y. Ishii, H. Sakai, and H. Murata, Thin Solid Films, 518, 647 (2009). [DOI: http://dx.doi.org/10.1016/j.tsf.2009.07.061].
DOI
ScienceOn
|
9 |
D. H. Reneker, A. L. Yarin, H. Fong, and S. Koombhongse, J. Appl. Phys., 87, 4531 (2000). [DOI: http://dx.doi.org/10.1063/1.373532].
DOI
ScienceOn
|
10 |
S. V. Fridrikh, J. H. Yu, M. P. Brenner, and G. C. Rutledge, Phys. Rev. Lett., 90, 14450 (2003). [DOI: http://dx.doi.org/10.1103/PhysRevLett.90.144502].
DOI
ScienceOn
|
11 |
A. Singh, J. Jayaram, M. Madou, and S. Akbar, J. Electrochem. Soc., 149, E78 (2002). [DOI: http://dx.doi.org/10.1149/1.1436085].
DOI
ScienceOn
|
12 |
C. S. Sharma, H. Katepalli, A. Sharma, and Marc Madou, Carbon, 49 1727 (2011). [DOI: http://dx.doi.org/10.1016/j.carbon.2010.12.058].
DOI
ScienceOn
|