Dependence of Electrons Loss Behavior on the Nitride Thickness and Temperature for Charge Trap Flash Memory Applications |
Tang, Zhenjie
(College of Physics and Electronic Engineering, Anyang Normal University)
Ma, Dongwei (College of Physics and Electronic Engineering, Anyang Normal University) Jing, Zhang (College of Physics and Electronic Engineering, Anyang Normal University) Jiang, Yunhong (College of Physics and Electronic Engineering, Anyang Normal University) Wang, Guixia (College of Physics and Electronic Engineering, Anyang Normal University) Li, Rong (School of Mathematics and Statistics, Anyang Normal University) Yin, Jiang (Department of Materials Science and Engineering, National Laboratory of Solid State Microstructures, Nanjing University) |
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