Browse > Article
http://dx.doi.org/10.4313/TEEM.2014.15.1.45

Effect of Ag Capping Layer on the Emission Characteristics of Transparent Organic Light-emitting Devices with Ca/Ag Double-layer Cathodes  

Lee, Chan-Jae (Display Components & Materials Research Center, Korea Electronics Technology Institute)
Moon, Dae-Gyu (Department of Materials Engineering, Soonchunhyang University)
Publication Information
Transactions on Electrical and Electronic Materials / v.15, no.1, 2014 , pp. 45-48 More about this Journal
Abstract
We have investigated the effects of an Ag capping layer on the emission characteristics of transparent organic light-emitting devices with Ca/Ag double-layer cathodes. The thickness of the Ag layer was varied from 10 to 30 nm, whereas the Ca was fixed to be a 10 nm in the Ca/Ag structure. The luminance and current efficiency on the cathode and anode sides are significantly dependent on the Ag thickness. For example, the current efficiency on the anode side increases from 8.4 to 11.7 cd/A, whereas, on the cathode side, it decreases from 3.2 to 0.2 cd/A as the Ag thickness increases from 10 to 30 nm. These changes in emission characteristics were investigated by measuring electroluminescence, transmission, and reflection spectra.
Keywords
Organic light-emitting devices; Transparent OLED; Transparent cathode; Ca/Ag cathode;
Citations & Related Records
연도 인용수 순위
  • Reference
1 C. W. Tang and S. A. VanSlyke, Appl. Phys. Lett., 51, 913 (1987) [DOI: http://dx.doi.org/10.1063/1.98799].   DOI
2 B. W. D'Andrad and S. R. Forrest, Adv. Mater., 16, 1585 (2004) [DOI: http://dx.doi.org/10.1002/adma.200400684].   DOI   ScienceOn
3 P. E. Burrows and S. R. Forrest, Appl. Phys. Lett., 64, 2285 (1994) [http://dx.doi.org/10.1063/1.111645].   DOI
4 L. S. Hung, C. W. Tang, M. G. Mason, P. Raychaudhuri, and J. Madathil, Appl. Phys. Lett., 78, 544 (2001) [DOI: http://dx.doi.org/10.1063/1.1327273].   DOI   ScienceOn
5 S.L. Lai, M. Y. Chan, M. K. Fungs, C. S. Lee, L. S. Hung, and S. T. Lee, Chem. Phys. Lett., 366, 128 (2002) [DOI: http://dx.doi.org/10.1016/S0009-2614(02)01553-1].   DOI
6 H. Riel, S. Karg, T. Beierlein, B. Ruhstaller, and W. Riess, Appl. Phys. Lett., 82, 466 (2003) [DOI: http://dx.doi.org/10.1063/1.1537052].   DOI   ScienceOn
7 R. B. Pode, C. J. Lee, D. G. Moon, and J. I. Han, Appl. Phys. Lett., 84, 4614 (2004) [DOI: http://dx.doi.org/10.1063/1.1756674].   DOI   ScienceOn
8 C. J. Lee, R. B. Pode, D. G. Moon, and J. I. Han, Thin Solid Films, 467, 201 (2004) [DOI: http://dx.doi.org/10.1016/j.tsf.2004.04.016].   DOI
9 C. J. Lee, R. B. Pode, J. I. Han, and D. G. Moon, Appl. Phys. Lett., 89, 123501, (2006) [DOI: http://dx.doi.org/10.1063/1.2355464].   DOI   ScienceOn
10 S. Y. Kim, D. G. Moon, C. J. Lee, and J. I. Han, Thin Solid Films, 517, 2035 (2009) [DOI: http://dx.doi.org/10.1016/j.tsf.2008.10.003].   DOI   ScienceOn
11 H. Riel, S. Karg, T. Beierlein, B. Ruhstaller, W. Riess, and K. Neyts, J. Appl. Phys., 94, 5290 (2003) [DOI: http://dx.doi.org/10.1063/1.1605256].   DOI   ScienceOn
12 V. Bulvic, V. B. Khalfin, G. Gu, P. E. Burrows, D. Z. Garbuzov, and S. R. Forrest, Phys. Rev. B, 58, 3730 (1998) [DOI: http://dx.doi.org/10.1103/PhysRevB.58.3730].   DOI   ScienceOn
13 G. G. Qin, A. G. Xu, G. L. Ma, G. Z. Ran, Y. P. Qiao, B. R. Zhang, W. X. Chen, and S. K. Wu, Appl. Phys. Lett., 85, 5406 (2004) [DOI: http://dx.doi.org/10.1063/1.1823601].   DOI   ScienceOn