1 |
A. G. Sellars, O. Farish, and B. F. Hampton, IEEE Trans. on Dielectr. Electr. Insul., 323 (1994) [DOI: http://dx.doi.org/10.1109/94.300265].
DOI
|
2 |
B. F. Hampton and R. J. Meats, IEE Proceedings C, 137 (1988) [DOI: http://dx.doi.org/10.1049/ip-c.1988.0017].
DOI
|
3 |
J. S. Pearson, O. Farish, B. F. Hampton, M. D. Judd, D. Templeton, B. M. Pryor, and I. M. Welch, IEEE Trans. Dielectr Electr. Insul., 893 (1995) [DOI: http://dx.doi.org/10.1109/94.469984].
DOI
ScienceOn
|
4 |
J. Y. Lim and J. Koo, J. Kor. Phys. Soc., 755 (2003).
|
5 |
M. D. Judd, O. Farish, B. F. Hampton, IEEE Trans. On DEI., 213 (1996).
|
6 |
N. Kock, B. Cornic, and R. Pietsch, IEEE Electr. Insul. Magazine, 20 (1996).
|
7 |
Koo, J. Yoon, J. Lim, Y. Chang , and Y. Kang, C, 335 (ISH. 2003).
|
8 |
Micro Wave Studio V5.0 (Computer Simulation Technology, 2004).
|
9 |
H. Doi, H. Muto, M. Fujii, and H. Kamei, Proc. IEE High Voltage Engineering Symposium, 70 (1999).
|
10 |
M. D. Judd, in "Dielectric Windows Improve Sensitivity of Partial Discharge Detection at UHF" (Conference Record of the 2000 IEEE International Symposium on Electrical Insulation, CA USA, 2000).
|
11 |
L. Yang, B. G. Stewart, A. J. Reid, M. D. Judd, and R. A. Fouracre, in "Proceeding of the 14th International Symposium on High Voltage Engineering" (Tsinghua University, Beijing, 2005) p. 347.
|
12 |
S. Y. Jung, J. Y. Koo, Y. M. Jang, K. J. Park, and C. W. Kang, in "Proceeding of the 14th International Symposium on High Voltage Engineering" (Tsinghua University, Beijing, 2005) p. 382.
|
13 |
Suwarno and T. Mizutani, in "Proceeding of 2008 International Conference on Condition Monitoring and Diagnosis" (North China Electric University, Beijing, 2008) p. 60.
|
14 |
S. G. Goo, H. J. Ju, K. J. Park, K. S. Han, and J. Y. Yoon, in "Proceeding of 2008 International Conference on Condition Monitoring and Diagnosis" (North China Electric University, Beijing, 2008) p. 64.
|