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http://dx.doi.org/10.4313/TEEM.2013.14.2.86

Influence of RF Magnetron Sputtering Condition on the ZnO Passivating Layer for Dye-sensitized Solar Cells  

Rhee, Seung Woo (Department of Electrical Engineering, Gachon University)
Choi, Hyung Wook (Department of Electrical Engineering, Gachon University)
Publication Information
Transactions on Electrical and Electronic Materials / v.14, no.2, 2013 , pp. 86-89 More about this Journal
Abstract
Dye-sensitized solar cells have a FTO/$TiO_2$/Dye/Electrode/Pt counter electrode structure, yet more than a 10% electron loss occurs at each interface. A passivating layer between the $TiO_2$/FTO glass interface can prevent this loss of electrons. In theory, ZnO has excellent electron collecting capabilities and a 3.4 eV band gap, which suppresses electron mobility. FTO glass was coated with ZnO thin films by RF-magnetron sputtering; each film was deposited under different $O_2$:Ar ratios and RF-gun power. The optical transmittance of the ZnO thin film depends on the thickness and morphology of ZnO. The conversion efficiency was measured with the maximum value of 5.22% at an Ar:$O_2$ ratio of 1:1 and RF-gun power of 80 W, due to effective prevention of the electron recombination into electrolytes.
Keywords
ZnO passivating layer; RF-magnetron sputter; Dye-sensitized solar cells; Electron recombination;
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