| 1 |
S. A. Wolf, A. Y. Chtchelkanova, and D. M. Treger, IBM J. Res. Dev. 50, 101 (2006).
DOI
|
| 2 |
J. C. Sankey, Y. T. Cui, J. Z. Sun, J. C. Slonczewski, R. A. Buhrman, and D. C. Ralph, Nat. Phys. 4, 67 (2008) [DOI: 10.1038/nphys783].
DOI
|
| 3 |
Y. B. Bazaliy, Phys. Rev. B 76, 140402(R) (2007) [DOI:10.1103/PhysRevB.76.140402].
DOI
ScienceOn
|
| 4 |
M. Wuttig and N. Yamada, Nat. Mater. 6, 824 (2007) [DOI:10.1038/nmat2009].
DOI
ScienceOn
|
| 5 |
R. E. Simpson, M. Krbal, P. Fons, A. V. Kolobov, J. Tominaga, T. Uruga, and H. Tanida, Nano Lett. 10, 414 (2009) [DOI:10.1021/nl902777z].
DOI
ScienceOn
|
| 6 |
D. Lelmini, A. L. Lacaita, and D. Mantegazza, IEEE Trans. Electron Dev. 54, 308 (2007) [DOI: 10.1109/TED.2006.888752].
DOI
ScienceOn
|
| 7 |
R. Venkatasubramanian, Nature, 463, 619 (2010) [DOI: 10.1038/463619a].
DOI
ScienceOn
|
| 8 |
J. S. Jin., J. S. Lee, and O. Kwon, Appl. Phys. Lett. 92, 171910 (2008) [DOI: 10.1063/1.2917454].
DOI
ScienceOn
|
| 9 |
J. Akerman, Science 308, 508 (2005) [DOI: 10.1126/science.1110549].
DOI
ScienceOn
|
| 10 |
S. Tehrani, J. M. Slaughter, M. Deherrera, B. N. Engel, N. D. Rizzo, J. Salter, M. Durlam, R. W. Dave, J. Janesky, B. Butcher, K. Smith, and G. Grynkewich, IEEE Proc. 91, 703 (2003)[DOI:10.1109/JPROC.2003.811804].
DOI
ScienceOn
|
| 11 |
L. O. Chua, IEEE Trans. Circuit Theory CT-18, 507 (1971).
|
| 12 |
M. Meier, C. Schindler, S. Gilles, R. Rosezin, A. Rudiger, C. Kugeler, and R. Waser, IEEE Electron Device Lett. 30, 8 (2009) [DOI: 10.1109/LED.2008.2008108].
DOI
ScienceOn
|
| 13 |
L. O. Chua and S. M. Kang, Proc. IEEE 64, 209 (1976).
DOI
ScienceOn
|
| 14 |
O. Kavehei, A. Iqbal, Y. S. Kim, K. Eshraghian, S. F. Al-Sarawi, and D. Abbott, Proc. R. Soc. A 466, 2175 (2010) [DOI: 10.1098/rspa.2009.0553].
DOI
ScienceOn
|
| 15 |
D. B. Strukov, G. S. Snider, D. R. Stewart, and R. S. Williams, Nature 453, 80 (2008) [DOI: 10.1038/nature06932].
DOI
ScienceOn
|
| 16 |
L. D. Jackel, H. P. Graf, and R. E. Howard, Appl. Opt. 26, 5077 (1987) [DOI: 10.1364/AO.26.005077].
DOI
|
| 17 |
W. Xu, T. Zhang, and Y. Chen, IEEE Trans. Very Large Scale Integr. (VLSI) Syst. 18, 66 (2010) [DOI: 10.1109/TVLSI.2008.2007735].
DOI
ScienceOn
|
| 18 |
A. Wegener, IEEE Signal Processing Mag. 27, 125 (2010) [DOI:10.1109/MSP.2010.936781].
DOI
ScienceOn
|
| 19 |
N. Engheta, Science 317, 1698 (2007) [DOI: 10.1126/science.1133268].
DOI
ScienceOn
|
| 20 |
K. Eshraghian, Proc. IEEE 94, 1197 (2006) [DOI:10.1109/JPROC.2006.873615].
DOI
ScienceOn
|
| 21 |
P. Abshire and A. G. Andreou, Proc. IEEE 89, 1052 (2001) [DOI:10.1109/5.939817].
DOI
ScienceOn
|
| 22 |
E. W. H. Jager, O. Inganas, and I. Lundstrom, Science 288, 2335 (2000) [DOI: 10.1126/science.288.5475.2335].
DOI
ScienceOn
|
| 23 |
C. Mavroidis, A. Dubey, and M. L. Yarmush, Ann. Rev. Biomed. Eng. 6, 363 (2004) [DOI: 10.1146/annurev.bioeng.6.040803.140143].
DOI
ScienceOn
|
| 24 |
International Technology Roadmap for Semiconductors (2009), ITRS 2009 Edition, Emerging Research Devices. from http://www.itrs.net.
|
| 25 |
M. Di Ventura, Y. V. Pershin, and L. O. Chua, Proc. IEEE 97, 1371(2009) [DOI: 10.1109/JPROC.2009.2022882].
DOI
ScienceOn
|
| 26 |
S. R. Ovshinsky, Phys. Rev. Lett. 21, 1450 (1968) [DOI:10.1103/PhysRevLett.21.1450].
DOI
|
| 27 |
H. F. Hamann, M. O'Boyle, Y. C. Martin, M. Rooks, and H. K. Wickramasinghe, Nat. Mater. 5, 383 (2006) [DOI: 10.1038/nmat1627].
DOI
ScienceOn
|
| 28 |
R. Waser, R. Dittmann, G. Staikov, and K. Szot, Adv. Mater. 21, 2632 (2009) [DOI: 10.1002/adma.200900375].
DOI
ScienceOn
|
| 29 |
H. Ishiwara, Curr. Appl. Phys. 9, S2 (2009) [DOI:10.1016/j.cap.2008.02.013].
DOI
ScienceOn
|
| 30 |
Y. Zheng, G. X. Ni, C. T. Toh, M. G. Zeng, S. T. Chen, K. Yao, and B. Ozyilmaz, Appl. Phys. Lett. 94, 163505 (2009) [DOI:10.1063/1.3119215].
DOI
ScienceOn
|
webmaster
