[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.4313/TEEM.2003.4.5.024

The Study of Phase-change with Temperature and Electric field in Chalcogenide Thin Film

Yang, Sung-Jun (Department of Electronic Materials Engineering, Kwangwoon University)
Shin, Kyung (Department of Electronic Materials Engineering, Kwangwoon University)
Park, Jung-Il (Department of Electronic Materials Engineering, Kwangwoon University)
Lee, Ki-Nam (Department of Electronic Materials Engineering, Kwangwoon University)
Chung, Hong-Bay (Department of Electronic Materials Engineering, Kwangwoon University)

Publication Information

Transactions on Electrical and Electronic Materials / v.4, no.5, 2003 , pp. 24-27 More about this Journal

Abstract

We have been investigated phase-change with temperature and electric field in chalcogenide Ge $_2$ Sb $_2$ Te $\sub$ 5/ thin film. T $\sub$ c/(crystallization temperature) is confirmed by measuring the resistance with the varying temperature on the hotplate. We have measured I-V characteristics with Ge $_2$ Sb $_2$ Te $\sub$ 5/ chalcogenide thin film. It is compared with I-V characteristics after impress the variable pulse. The pulse has variable height and duration.

Keywords

Phase-change; Nonvolatile; Ge $_2$ Sb $_2$ Te $_{}$ 5/; C-RAM; Chalcogenide memory;

Citations & Related Records

Times Cited By KSCI : 1 (Citation Analysis)

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