[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.4313/TEEM.2003.4.5.015

A Polycrystalline CdZnTe Film and Its X-ray Response Characteristics for Digital Radiography

Kim, Jae-Hyung (School of Computer Aided Science, Inje University)
Park, Chang-Hee (School of Computer Aided Science, Inje University)
Kang, Sang-Sik (Department of Biomedical Engineering, Inje University)
Nam, Sang-Hee (Department of Biomedical Engineering, Inje University)

Publication Information

Transactions on Electrical and Electronic Materials / v.4, no.5, 2003 , pp. 15-18 More about this Journal

Abstract

The Cd $\_$ 1-x/Zn $\_$ x/Te film was produced by thermal evaporation for the flat-panel X-ray detector. The crystal structure and the surface morphology of poly crystalline Cd $\_$ 1-x/Zn $\_$ x/Te film were examined using XRD and SEM, respectively. The leakage current and X-ray sensitivity of the fabricated films were measured to analyze the X-ray response characteristic of Zn in a polycrystalline CdZnTe thin film. The leakage current and the output charge density of Cd $\_$ 0.7/Zn $\_$ 0.3/Te thin film were measured to 0.3 1nA/ $\textrm{cm}^2$ and 260 pC/ $\textrm{cm}^2$ at an applied voltage of 2.5 V/ $\mu\textrm{m}$ , respectively. Experimental results showed that the increase of Zn doping rates in Cd $\_$ 1-x/Zn $\_$ x/Te detectors reduced the leakage current and improved the X-ray sensitivity significantly. The leakage current was drastically diminished by the formation of thin parylene layer in the Cd $\_$ 0.7/Zn $\_$ 0.3/Te detector.

Keywords

CdZnTe detectors; Digital radiography; Leakage current; X-ray sensitivity; Parylene layer;

Citations & Related Records

Times Cited By KSCI : 2 (Citation Analysis)

Reference
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