1 |
C. W. Ho, D. A. Chance, C. H. Bajorek, and R. E. Acosta, 'The thin film module as a high performance semiconductor package', IBM J. Res.Develop., Vol. 26, No. 3, p. 286, 1982
DOI
|
2 |
C. M. Osburn and D. W. Ormond, 'Dielecthc breakdown in silicon dioxide films on silicon (1)', J.Electrochem.Soc., Vol. 119, No. 5, p. 591, 1972
DOI
|
3 |
C. M. Osburn and N. J. Chou, 'Accelerated dielectric breakdown of silicon dioxide films', J. Electrochem. Soc., Vol. 120, No. 10, p. 1377, 1973
DOI
|
4 |
Munir H. Nayfeh and Morton K. Brussel, 'Electricity and magnetism (in Korean)', 1990
|
5 |
S. B. Park, 'Theory of alternating current circuit',Mun Un Dang, p. 86,1983
|
6 |
Y. Inagaki, N. Tsuchida, and S. Nitta, 'Dielectric breakdown properties of evaporated SiO films', J. I.E. E. J, Vol. 89-9, No. 972, p. 206, 1969
|
7 |
C. M. Osburn and D. W. Ormond, , J.Electrochem. Soc., Vol. 119, No. 5, p. 597, 1972
|