80μW/MHz 0.68V Ultra Low-Power Variation-Tolerant Superscalar Dual-Core Application Processor |
Kwon, Youngsu
(SoC Research Department, Electronics and Telecommunications Research Institute (ETRI))
Lee, Jae-Jin (SoC Research Department, Electronics and Telecommunications Research Institute (ETRI)) Shin, Kyoung-Seon (SoC Research Department, Electronics and Telecommunications Research Institute (ETRI)) Han, Jin-Ho (SoC Research Department, Electronics and Telecommunications Research Institute (ETRI)) Byun, Kyung-Jin (SoC Research Department, Electronics and Telecommunications Research Institute (ETRI)) Eum, Nak-Woong (SoC Research Department, Electronics and Telecommunications Research Institute (ETRI)) |
1 | Y. Shin, et al., "28nm high- metal-gate heterogeneous quad-core CPUs for high-performance and energyefficient mobile application processor," Proc. of Int'l Solid-State Circuits Conference, pp. 154-155, 2013. |
2 | H. Kaul, et al., "A 320mw 411 GOPS/Watt ultra low voltage motion estimation accelerator in 65nm CMOS," IEEE Journal of Solid-State Circuits, vol. 44, no. 1, pp. 107-114, Jan. 2009. DOI ScienceOn |
3 | S. Jain, et al., "A 280mV-to-1.2V wide-operatingrange IA-32 processor in 32nm CMOS," Proc. of Intl. Solid-State Circuits Conference, pp. 66-68, 2012. |
4 | S. Das, et al., "A self-tuning DVS processing using delay-error detection and correction," IEEE J. Solid-State Circuits, vol. 41, no. 4, pp. 792-804, Apr. 2006. DOI ScienceOn |
5 | A. Raychowdhury, et al., "Error detection and correction in microprocessor core and memory due to fast dynamic voltage droops.", IEEE J. on Emerging and Selected Topics in Circuits and Systems, vol. 1, no. 3, pp. 208-217, Sep. 2011 DOI ScienceOn |
6 | J. A. Poobey, et al., "A benchmark characteriation of the EEMBC benchmark suite," IEEE Micro, vol. 29, no. 5, pp. 18-29, 2009 DOI |
7 | K. A. Bowman et al., "Adaptive and resilient circuits for dynamic variation tolerance," IEEE Design & Test, vol. 30, issue 6, pp. 8-13, 2013 DOI |
8 | U. R. Karpuzcu et al., "Coping with parametric variation at near-threshold voltages," vol. 33, issue 4, pp. 6-14, 2013 DOI |