[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.5573/JSTS.2017.17.4.543

Advanced On-chip SOL Calibration Method for Unknown Fixture De-embedding

Yoon, Changwook (Intel Corporation)
Chen, Bichen (EMC Laboratory, Missouri University of Science and Technology)
Ye, Xiaoning (Intel Corporation)
Fan, Jun (EMC Laboratory, Missouri University of Science and Technology)

Publication Information

JSTS:Journal of Semiconductor Technology and Science / v.17, no.4, 2017 , pp. 543-551 More about this Journal

Abstract

SOL (Short, Open and Load) calibration based on iterative error sensitivity is proposed in this paper. With advanced SOL calibration, unknown parasitic parameters at on-chip terminations are accurately estimated up to 20 GHz. Artificial terminations are designed on printed circuit board (PCB) to experiment the proposed method. On-chip SHORT, OPEN and LOAD fabricated inside silicon shows the accuracy of proposed calibration method through the comparison with known fixture S-parameter after de-embedding.

Keywords

SOL calibration; iterative error sensitivity; de-embedding;

Citations & Related Records

Reference

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