[KSCI] Korea Science Citation Index Service

http://dx.doi.org/10.5573/JSTS.2014.14.5.503

On-State Resistance Instability of Programmed Antifuse Cells during Read Operation

Han, Jae Hwan (Department of Electronic Engineering, Sogang University)
Lee, Hyunjin (Department of Electronic Engineering, Sogang University)
Kim, Wansoo (Department of Electronic Engineering, Sogang University)
Yoon, Gyuhan (Department of Electronic Engineering, Sogang University)
Choi, Woo Young (Department of Electronic Engineering, Sogang University)

Publication Information

JSTS:Journal of Semiconductor Technology and Science / v.14, no.5, 2014 , pp. 503-507 More about this Journal

Abstract

The on-state resistance ( $R_{ON}$ ) instability of standard complementary metal-oxide-semiconductor (CMOS) antifuse cells has been observed for the first time by using acceleration factors: stress current and ambient temperature. If the program current is limited, the $R_{ON}$ increases as time passes during read operation.

Keywords

Antifuse; reliability; on-state resistance instability;

Citations & Related Records

Reference

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