1 |
Sentaurus Device User Guide, Synopsys Inc. Version E-2010.12.
|
2 |
Ligament User Guide, Synopsys Inc. Version E- 2010.12.
|
3 |
Taurus TSUPREM-4 User Guide, Synopsys Inc. Version E-2010.12.
|
4 |
K. T. Kaschani, and R. Gärtner, "The Impact of Electrical Overstress on the Design, Handling and Application of Integrated Circuits," EOS/ESD Symp., pp. 1-10, 2011.
|
5 |
J.-H. Kim, et al, "A Consideration on the Electrical Overstress (EOS) Failure Mechanism in the Interconnection System of Liquid Crystal Display (LCD) Panel," Electronic Manuf. Tech. Symp., pp. 1-4, Apr., 2010.
|
6 |
M.-D. Ker, and T.-Y. Chen, "Substrate-Triggered ESD Protection Circuit Without Extra Process Modification," Solid-State Circuits, IEEE Journal of, Vol.38, No.2, pp.295-302, Feb., 2003.
DOI
ScienceOn
|
7 |
M.-D. Ker, and T.-H. Lai,, "Investigation on Robustness of CMOS Devices Against Cable Discharge Event (CDE) Under Different Layout Parameters in a Deep-Submicrometer CMOS Technology," Electromagnetic Compatibility, IEEE Transactions on, Vol.50, No.4, pp.810-821, Nov., 2008.
DOI
ScienceOn
|
8 |
J. E. Vinson, and J. J. Liou, "Electrostatic Discharge in Semiconductor Devices: Protection Techniques," Proceedings of the IEEE, Vol.88, No.12, pp.1878-1900, Dec., 2000.
DOI
ScienceOn
|