1 |
W. Yang, O. B. Kwon, J. I. Lee, G. T. Hwang, and S. J. Lee, "An integrated 800600 CMOS imaging system," ISSCC Dig. Tech. Papers, pp. 304-305, Feb., 1999.
|
2 |
D. Lee and G. Han, "High-speed, low-power correlated double sampling counter for columnparallel CMOS imagers," Electronics Letters, Vol. 43, No. 24, pp. 1362-1364, Nov. 2007.
DOI
ScienceOn
|
3 |
Y. Chae, J. Cheon, S. Lim, M. Kwon, K. Yoo, W. Jung, D. H. Lee, S. Ham, and G. Han, "A 2.1 Mpixels, 120 frame/s CMOS image sensor with column-parallel ADC architecture," IEEE J. Solid-State Circuits, vol. 46, no. 1, pp. 236-247, Jan. 2011.
DOI
ScienceOn
|
4 |
Y. Nitta, Y. Muramatsu, K. Amano, T. Toyama, J. Yamamoto, K. Mishina, A. Suzuki, T. Taura, A. Kato, M. Kikuchi, Y. Yasui, H. Nomura, and N. Fukushima, "High-speed digital double sampling with analog CDS on column parallel ADC architecture for low-noise active pixel sensor," ISSCC Dig. Tech. Papers, pp. 500-501, Feb. 2006.
|
5 |
S. Yoshihara, M. Kikuchi, Y. Ito, Y. Inada, S. Kuramochi, H. Wakabayashi, M. Okano, K. Koseki, H. Kuriyama, J. Inutsuka, A. Tajima, T. Nakajima, Y. Kudoh, F. Koga, Y. Kasagi, S. Watanabe, and T. Nomoto, "A 1/1.8-inch 6.4Mpixel 60 frames/s CMOS image sensor with seamless mode change," IEEE J. Solid-State Circuits, vol. 41, no. 12, pp. 2998-3006, Dec. 2006.
DOI
ScienceOn
|
6 |
Y. Lim, K. Koh, K. Kim, H. Yang, J. Kim, Y. Jeong, S. Lee, H. Lee, S. H. Lim, Y. Han, J. Kim, J. Yun, S. Ham, and Y. T. Lee, "A 1.1e- temporal noise 1/3.2-inch 8Mpixel CMOS image sensor using pseudomultipl sampling," ISSCC Dig. Tech. Papers, pp. 396-397, Feb. 2010.
|
7 |
T. Toyama, K. Mishina, H. Tsuchiya, T. Ichikawa, H. Iwaki, Y. Gendai, H. Murakami, K. Takamiya, H. Shiroshita, Y. Muramatsu, and T. Furusawa, "A 17.7Mpixel 120fps CMOS Image Sensor with 34.8Gb/s Readout," ISSCC Dig. Tech. Papers, pp. 420-422, Feb., 2011.
|
8 |
S. Lim, J. Lee, D. Kim, and G. Han, "A high-speed CMOS image sensor with column-parallel two-step single-slope ADCs," IEEE Trans. Electron Devices, vol. 56, no. 3, pp. 393-393, Mar. 2009.
DOI
ScienceOn
|
9 |
S. Lim, J. Cheon, Y. Chae, W. Jung, D. H. Lee, M. Kwon, K. Yoo, S. Ham, and G. Han, "A 240-frames/s 2.1-Mpixel CMOS image sensor with column-shared cyclic ADCs" IEEE J. Solid-State Circuits, vol. 46, no. 9, pp. 2073-2083, Sep. 2011.
DOI
ScienceOn
|
10 |
I. Takayanagi, M. Shirakawa, K. Mitani, M. Sugawara, S. Iversen, J. Moholt, J. Nakamura, and E. R. Fossum, "A 1.25-inch 60-frames/s 8.3-Mpixel digital-output CMOS image sensor," IEEE J. Solid-State Circuits, vol. 40, no. 11, pp. 2305-2314, Nov. 2005.
DOI
ScienceOn
|
11 |
K. Findlater, R. Henderson, D. Baxter, J. E. D. Hurwitz, L. Grant, Y. Cazaux, F. Roy, D. Herault, and Y. Marcellier, "SXGA pinned photodiode CMOS image sensor in 0.35 technology," ISSCC Dig. Tech. Papers, pp. 218-219, Feb. 2003.
|
12 |
A. I. Krymski, N. E. Bock, N. Tu, D. V. Blerkom, and E. R. Fossum, "A high-speed, 240-frames/s, 4.1-Mpixel CMOS sensor" IEEE Trans. Electron Devices, vol. 50, no. 1, pp. 130-135, Jan. 2003.
DOI
ScienceOn
|
13 |
H. Takahashi, T. Noda, T. Matsuda, T. Watanabe, M. Shinohara, T. Endo, S. Takimoto, R. Mishima, S. Nishimura, K. Sakurai, H. Yuzurihara, and S. Inoue, "A 1/2.7-in 2.96 Mpixel CMOS image sensor with double CDS architecture for full high-definition camcorders," IEEE J. Solid-State Circuits, vol. 42, no. 12, pp. 2960-2967, Dec. 2007.
DOI
ScienceOn
|
14 |
K. Yonemoto and H. Sumi, "A CMOS image sensor with a simple fixed-pattern-noise-reduction technology and a hole accumulation diode" IEEE J. Solid-State Circuits, vol. 35, no. 12, pp. 2038-2043, Dec. 2000.
DOI
ScienceOn
|
15 |
J. Cheon and G. Han, "Noise analysis and simulation method for a single-slope ADC with CDS in a CMOS image sensor," IEEE Trans. Circuits Syst. I, vol. 55, no. 10, pp. 2980-2987, Nov. 2008.
DOI
ScienceOn
|
16 |
M. J. Loinaz, K. J. Singh, A. J. Blanksby, D. A. Inglis, K. Azadet, and B. D. Ackland, "A 200-mW, 3.3-V, CMOS color camera IC producing 352288 24-b video at 30 frames/s," IEEE J. Solid-State Circuits, vol. 33, no. 12, pp. 2092-2103, Dec. 1998.
DOI
ScienceOn
|